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Search Results - Trujillo-Sevilla, J M
Search Results - Trujillo-Sevilla, J M
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Restoring Integral Images from Focal Stacks Using Compressed Sensing Techniques
by
Trujillo-Sevilla, J. M.
,
Katkovnik, Vladimir
,
Javidi, Bahram
,
Rodriguez-Ramos, J. M.
Published in
Journal of display technology
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High resolution imaging and wavefront aberration correction in plenoptic systems
by
Trujillo-Sevilla, J M
,
Rodríguez-Ramos, L F
,
Montilla, I
,
Rodríguez-Ramos, J M
Published in
Optics letters
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Roughness and nanotopography measurement of a Silicon Wafer using Wave Front Phase Imaging : High speed single image snapshot of entire wafer producing sub nm topography data
by
Trujillo-Sevilla, J.M.
,
Ramos-Rodriguez, J.M.
,
Gaudestad, Jan
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Wave Front Phase Imaging of Wafer Warpage : Advanced new metrology technique for blank incoming wafers
by
Trujillo-Sevilla, J.M.
,
Ramos-Rodriguez, J.M.
,
Gaudestad, Jan
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Depth map extraction from light field microscopes
by
Thomas, M. G.
,
Marichal-Hernandez, J. G.
,
Fernandez-Valdivia, J. J.
,
Trujillo-Sevilla, J. M.
,
Rodriguez-Ramos, J. M.
,
Montilla, I.
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Tomographic microscopy using a plenoptic sensor
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Trujillo-Sevilla, J.
,
Rodriguez-Ramos, J. M.
,
Rodriguez-Ramos, L. F.
,
Javidi, B.
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New developments at CAFADIS plenoptic camera
by
Rodriguez-Ramos, J. M.
,
Marichal-Hernandez, J. G.
,
Luke, J. P.
,
Trujillo-Sevilla, J.
,
Puga, M.
,
Lopez, M.
,
Fernandez-Valdivia, J. J.
,
Dominguez-Conde, C.
,
Sanluis, J. C.
,
Rosa, F.
,
Guadalupe, V.
,
Quintero, H.
,
Militello, C.
,
Rodriguez-Ramos, L. F.
,
Lopez, R.
,
Montilla, I.
,
Femenia, B.
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