Search Results - Tsai, Nova Cheng-Yen

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  1. 1
    Machine Learning-Based Detection Method for Wafer Test Induced Defects

    Machine Learning-Based Detection Method for Wafer Test Induced Defects by Cheng, Ken Chau-Cheung, Chen, Leon Li-Yang, Li, Ji-Wei, Li, Katherine Shu-Min, Tsai, Nova Cheng-Yen, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Lee, Chen-Shiun, Chen, Jwu E., Liang, Hsing-Chung, Hsu, Chun-Lung

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  2. 2
    TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning

    TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning by Li, Katherine Shu-Min, Chen, Leon Li-Yang, Cheng, Ken Chau-Cheung, Liao, Peter Yi-Yu, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Tsai, Nova Cheng-Yen, Lee, Chen-Shiun

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  3. 3
    TestDNA: Novel Wafer Defect Signature for Diagnosis and Pattern Recognition

    TestDNA: Novel Wafer Defect Signature for Diagnosis and Pattern Recognition by Li, Katherine Shu-Min, Tsai, Nova Cheng-Yen, Cheng, Ken Chau-Cheung, Jiang, Xu-Hao, Liao, Peter Yi-Yu, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Lee, Chen-Shiun

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  4. 4
    Wafer Defect Pattern Classification with Explainable-Decision Tree Technique

    Wafer Defect Pattern Classification with Explainable-Decision Tree Technique by Cheng, Ken Chau-Cheung, Li, Katherine Shu-Min, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Lee, Chen-Shiun, Chen, Leon Li-Yang, Liao, Peter Yi-Yu, Tsai, Nova Cheng-Yen

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  5. 5
    TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning

    TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning by Chen, Leon Li-Yang, Li, Katherine Shu-Min, Cheng, Ken Chau-Cheung, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Tsai, Nova Cheng-Yen, Lee, Chen-Shiun

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  6. 6
    WGrid: Wafermap Grid Pattern Recognition with Machine Learning Techniques

    WGrid: Wafermap Grid Pattern Recognition with Machine Learning Techniques by Liao, Peter Yi-Yu, Shu-Min Li, Katherine, Chen, Leon Li-Yang, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chau-Cheung Cheng, Ken, Tsai, Nova Cheng-Yen, Chou, Leon

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  7. 7
    Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis

    Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis by Cheng, Ken Chau-Cheung, Shu-Min Li, Katherine, Huang, Andrew Yi-Ann, Li, Ji-Wei, Chen, Leon Li-Yang, Cheng-Yen Tsai, Nova, Wang, Sying-Jyan, Lee, Chen-Shiun, Chou, Leon, Liao, Peter Yi-Yu, Liang, Hsing-Chung, Chen, Jwu-E

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