32nm gate-first high-k/metal-gate technology for high performance low power applications by Diaz, C.H., Goto, K., Huang, H.T., Yasuda, Yu, Tsao, C.P., Chu, T.T., Lu, W.T., Chang, V., Hou, Y.T., Chao, Y.S., Hsu, P.F., Chen, C.L., Lin, K.C., Ng, J.A., Yang, W.C., Chen, C.H., Peng, Y.H., Chen, C.J., Chen, C.C., Yu, M.H., Yeh, L.Y., You, K.S., Chen, K.S., Thei, K.B., Lee, C.H., Yang, S.H., Cheng, J.Y., Huang, K.T., Liaw, J.J., Ku, Y., Jang, S.M., Chuang, H., Liang, M.S.

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A New Read Method by Using DIBL Characteristics in Nitride Storage Device by Chiang, L.P., Chen, P.A., Hung, C.H., Tsao, C.P., Liao, H.H., Lin, C.H.

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Age hardening reaction of the Al0.3CrFe1.5MnNi0.5 high entropy alloy by Tsao, L.C., Chen, C.S., Chu, C.P.

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Activity of Platinum-Based Chemotherapy in Patients With Advanced Prostate Cancer With and Without DNA Repair Gene Aberrations by Schmid, Sabine, Omlin, Aurelius, Higano, Celestia, Sweeney, Christopher, Martinez Chanza, Nieves, Mehra, Niven, Kuppen, Malou C P, Beltran, Himisha, Conteduca, Vincenza, Vargas Pivato de Almeida, Daniel, Cotait Maluf, Fernando, Oh, William K, Tsao, Che-Kai, Sartor, Oliver, Ledet, Elisa, Di Lorenzo, Giuseppe, Yip, Steven M, Chi, Kim N, Bianchini, Diletta, De Giorgi, Ugo, Hansen, Aaron R, Beer, Tomasz M, Lavaud, Pernelle, Morales-Barrera, Rafael, Tucci, Marcello, Castro, Elena, Karalis, Kostas, Bergman, Andries M, Le, Mo Linh, Zürrer-Härdi, Ursina, Pezaro, Carmel, Suzuki, Hiroyoshi, Zivi, Andrea, Klingbiel, Dirk, Schär, Sämi, Gillessen, Silke

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O-6 NON-INVASIVE ASSESSMENT OS HEPATIC FIBROSIS BEFORE AND AFTER HCV CURE AND CORRELATION WITH CLINICAL OUTCOMES by Ragazzo, T.G., Garcia-Tsao, G., Mazo, D.F., Ziteli, P.M., Oliveira, C.P., Singer, J.M., Carrilho, F.J., Pessoa, M.G.

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Study of interfacial reactions between Sn3.5Ag0.5Cu composite alloys and Cu substrate by Tsao, L.C., Chu, C.P., Peng, S.F.

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Coniferyl aldehyde 5-hydroxylation and methylation direct syringyl lignin biosynthesis in angiosperms by Osakabe, K, Tsao, C.C, Li, L, Popko, J.L, Umezawa, T, Carraway, D.T, Smeltzer, R.H, Joshi, C.P, Chiang, V.L

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Semi-solid deformation of non-dendritic structures—I. Phenomenological behavior by Chen, C.P., Tsao, C.-Y.A.

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The electrical properties of MIS capacitors with ALN gate dielectrics by Adam, T, Kolodzey, J, Swann, C.P, Tsao, M.W, Rabolt, J.F

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The electrical and optical properties of thin film diamond implanted with silicon by Roe, K.J, Kolodzey, J, Swann, C.P, Tsao, M.W, Rabolt, J.F, Chen, J, Brandes, G.R

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