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Search Results - Tsionenko, D. A.
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Computationally-effective ultra-wideband worst-case model of electromagnetic wave diffraction by aperture in conducting screen
by
Tsionenko, D. A.
,
Maly, S. V.
,
Sinkevich, E. V.
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Conference Proceedings
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Analytical Models
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Apertures
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Approximation Methods
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Diffraction
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Electromagnetic Compatibility
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Engineering
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Engineering, Electrical & Electronic
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Fraunhofer Diffraction
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Fresnel Diffraction
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Mathematical Model
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Science & Technology
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Technology
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Vectors
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Worst-Case Models
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Ieee Electronic Library (Iel) Conference Proceedings
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