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    Ultraflexible nanoelectronic probes form reliable, glial scar-free neural integration

    Ultraflexible nanoelectronic probes form reliable, glial scar-free neural integration by Luan, Lan, Wei, Xiaoling, Zhao, Zhengtuo, Siegel, Jennifer J, Potnis, Ojas, Tuppen, Catherine A, Lin, Shengqing, Kazmi, Shams, Fowler, Robert A, Holloway, Stewart, Dunn, Andrew K, Chitwood, Raymond A, Xie, Chong

    Published in Science advances
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