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EOT Scaling Via 300mm MX2 Dry Transfer - Steps Toward a Manufacturable Process Development and Device Integration
by
Ghosh, S.
,
Kruv, A.
,
Smets, Q.
,
Schram, T.
,
Leech, D. J.
,
Ding, T.
,
Turkani, V.
,
Groven, B.
,
Dangel, A.
,
Probst, G.
,
Uhrmann, T.
,
Wimplinger, M.
,
Asselberghs, I.
,
Lockhart de la Rosa, C. J.
,
Brems, S.
,
Kar, G. S.
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Dielectrics
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Epitaxial Growth
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Field Effect Transistors
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Logic Gates
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Optical Imaging
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Tin
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Very Large Scale Integration
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