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Search Results - Uždavinys, Tomas Kristijonas
Search Results - Uždavinys, Tomas Kristijonas
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Optical absorption edge broadening in thick InGaN layers: Random alloy atomic disorder and growth mode induced fluctuations
by
Butté, Raphaël
,
Lahourcade, Lise
,
Uždavinys, Tomas Kristijonas
,
Callsen, Gordon
,
Mensi, Mounir
,
Glauser, Marlene
,
Rossbach, Georg
,
Martin, Denis
,
Carlin, Jean-François
,
Marcinkevičius, Saulius
,
Grandjean, Nicolas
Published in
Applied physics letters
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Impact of surface morphology on the properties of light emission in InGaN epilayers
by
U davinys, Tomas Kristijonas
,
Marcinkevi ius, Saulius
,
Mensi, Mounir
,
Lahourcade, Lise
,
Carlin, Jean-François
,
Martin, Denis
,
Butté, Raphaël
,
Grandjean, Nicolas
Published in
Applied physics express
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Optical and interface properties of direct InP/Si heterojunction formed by corrugated epitaxial lateral overgrowth
by
Omanakuttan, Giriprasanth
,
Sacristán, Oscar Martínez
,
Marcinkevičius, Saulius
,
Uždavinys, Tomas Kristijonas
,
Jiménez, Juan
,
Ali, Hasan
,
Leifer, Klaus
,
Lourdudoss, Sebastian
,
Sun, Yan-Ting
Published in
Optical materials express
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Infrared absorption in KTP isomorphs induced with blue picosecond pulses
by
Tjörnhammar, Staffan
,
Maestroni, Valerio
,
Zukauskas, Andrius
,
Uždavinys, Tomas Kristijonas
,
Canalias, Carlota
,
Laurell, Fredrik
,
Pasiskevicius, Valdas
Published in
Optical materials express
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Intervalley energy of GaN conduction band measured by femtosecond pump-probe spectroscopy
by
Marcinkevičius, Saulius
,
Uždavinys, Tomas K.
,
Foronda, Humberto M.
,
Cohen, Daniel A.
,
Weisbuch, Claude
,
Speck, James S.
Published in
Physical review. B
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Scanning near-field microscopy of carrier lifetimes in m-plane InGaN quantum wells
by
Ivanov, Ruslan
,
Marcinkevičius, Saulius
,
Uždavinys, Tomas K.
,
Kuritzky, Leah Y.
,
Nakamura, Shuji
,
Speck, James S.
Published in
Applied physics letters
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Influence of well width fluctuations on recombination properties in semipolar InGaN quantum wells studied by time- and spatially-resolved near-field photoluminescence
by
Uždavinys, Tomas K.
,
Becerra, Daniel L.
,
Ivanov, Ruslan
,
DenBaars, Steven P.
,
Nakamura, Shuji
,
Speck, James S.
,
Marcinkevičius, Saulius
Published in
Optical materials express
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Direct Measurement of Nanoscale Lateral Carrier Diffusion: Toward Scanning Diffusion Microscopy
by
Mensi, Mounir
,
Ivanov, Ruslan
,
Uždavinys, Tomas K
,
Kelchner, Kathryn M
,
Nakamura, Shuji
,
DenBaars, Steven P
,
Speck, James S
,
Marcinkevičius, Saulius
Published in
ACS photonics
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