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Search Results - Udoni,Darlene M
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The effect of heavy ion strikes on charge trap memory arrays with analog state programmability
by
Patrick Xiao, T.
,
Bennett, Christopher H.
,
Dempsey, Ryan
,
Wilson, Donald
,
Joffrion, Joshua
,
Udoni, Darlene M.
,
Alec Talin, A.
,
Agrawal, Vineet
,
Puchner, Helmut
,
Marinella, Matthew J.
,
Agarwal, Sapan
,
Hughart, David R.
Published in
IEEE transactions on nuclear science
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Various Applications of Power Spectrum Analysis (PSA)
by
Tangyunyong,Paiboon
,
Udoni,Darlene M
,
Loubriel,Guillermo M
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Ieee Transactions On Nuclear Science
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Analog Computing
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Charge Trap Memory
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Etching
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Flash Memory
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Heavy Ion Irradiation
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In-Memory Computing
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Ions
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Logic Gates
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Nonvolatile Memory
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Programming
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Single Event Effects
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Single Event Upset
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Sonos
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Sonos Devices
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Tail
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Threshold Voltage
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Transistors
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