Search Results - Uekusa, Kouichiro

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    Photonic integration based on a ferroelectric thin-film platform

    Photonic integration based on a ferroelectric thin-film platform by Abe, Shunsuke, Joichi, Tomoki, Uekusa, Kouichiro, Hara, Hideo, Masuda, Shin

    Published in Scientific reports
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    A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing

    A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing by Yamaguchi, T.J., Kawabata, M., Soma, M., Ishida, M., Sawami, K., Uekusa, K.

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