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Electrically Active Defects Induced by α‐Particle Irradiation in p‐Type Si Surface Barrier Detector
by
Bakhlanov, Sergey
,
Bazlov, Nikolay
,
Chernobrovkin, Ilia
,
Danilov, Denis
,
Derbin, Alexander
,
Drachnev, Ilia
,
Kotina, Irina
,
Konkov, Oleg
,
Kuzmichev, Artem
,
Mikulich, Maksim
,
Muratova, Valentina
,
Trushin, Maxim
,
Unzhakov, Evgeniy
Published in
Physica status solidi. A, Applications and materials science
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Physica Status Solidi. A, Applications And Materials Science
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Aluminum
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Deep-Level Transient Spectroscopy
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Defects
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Irradiation
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Materials Science
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Materials Science, Multidisciplinary
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Physical Sciences
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Physics
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Physics, Applied
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Physics, Condensed Matter
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Radiation
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Radiation-Induced Defects
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Room Temperature
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Science & Technology
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Semiconductor Detectors
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Silicon
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Silicon Dioxide
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