Search Results - Uruma, Takeshi

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  1. 1
    Imaging of an Electret Film Fabricated on a Micro-Machined Energy Harvester by a Kelvin Probe Force Microscope

    Imaging of an Electret Film Fabricated on a Micro-Machined Energy Harvester by a Kelvin Probe Force Microscope by Nakazawa, Kenta, Fukazawa, Kengo, Uruma, Takeshi, Hashiguchi, Gen, Iwata, Futoshi

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  2. 2
    Development of scanning capacitance force microscopy using the dissipative force modulation method

    Development of scanning capacitance force microscopy using the dissipative force modulation method by Uruma, Takeshi, Satoh, Nobuo, Yamamoto, Hidekazu, Iwata, Futoshi

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  3. 3
    Investigation of an n− layer in a silicon fast recovery diode under applied bias voltages using Kelvin probe force microscopy

    Investigation of an n− layer in a silicon fast recovery diode under applied bias voltages using Kelvin probe force microscopy by Uruma, Takeshi, Satoh, Nobuo, Yamamoto, Hidekazu, Iwata, Futoshi

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  4. 4
    Development of atomic force microscopy combined with scanning electron microscopy for investigating electronic devices

    Development of atomic force microscopy combined with scanning electron microscopy for investigating electronic devices by Uruma, Takeshi, Tsunemitsu, Chiaki, Terao, Katsuki, Nakazawa, Kenta, Satoh, Nobuo, Yamamoto, Hidekazu, Iwata, Futoshi

    Published in AIP advances
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  5. 5
    Nanoscale observation of organic thin film by atomic force microscopy

    Nanoscale observation of organic thin film by atomic force microscopy by Mochizuki, Shota, Uruma, Takeshi, Satoh, Nobuo, Saravanan, Shanmugam, Soga, Tetsuo

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  6. 6
    Evaluation of carrier concentration reduction in GaN-on-GaN wafers by Raman spectroscopy and Kelvin force microscopy

    Evaluation of carrier concentration reduction in GaN-on-GaN wafers by Raman spectroscopy and Kelvin force microscopy by Yamamoto, Hidekazu, Agui, Kazuya, Uchida, Yuhki, Mochizuki, Shota, Uruma, Takeshi, Satoh, Nobuo, Hashizume, Tamotsu

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  7. 7
    Investigation of the depletion layer by scanning capacitance force microscopy with Kelvin probe force microscopy

    Investigation of the depletion layer by scanning capacitance force microscopy with Kelvin probe force microscopy by Uruma, Takeshi, Satoh, Nobuo, Yamamoto, Hidekazu

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  8. 8
    Observation of silicon carbide Schottky barrier diode under applied reverse bias using atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy

    Observation of silicon carbide Schottky barrier diode under applied reverse bias using atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy by Uruma, Takeshi, Satoh, Nobuo, Yamamoto, Hidekazu

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  9. 9
    Surface Potential Measurement of a Silicon Fast Recovery Diode under Applied Bias Voltages by Kelvin Probe Force Microscopy

    Surface Potential Measurement of a Silicon Fast Recovery Diode under Applied Bias Voltages by Kelvin Probe Force Microscopy by Uruma, Takeshi, Satoh, Nobuo, Yamamoto, Hidekazu, Iwata, Futoshi

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  10. 10
    Infection control for COVID-19 in hospital examination room

    Infection control for COVID-19 in hospital examination room by Takada, Mamoru, Fukushima, Taichi, Ozawa, Sho, Matsubara, Syuma, Suzuki, Takeshi, Fukumoto, Ichiro, Hanazawa, Toyoyuki, Nagashima, Takeshi, Uruma, Reiko, Otsuka, Masayuki, Tanaka, Gaku

    Published in Scientific reports
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  11. 11
    Camellianoside, a novel antioxidant glycoside from the leaves of Camellia japonica

    Camellianoside, a novel antioxidant glycoside from the leaves of Camellia japonica by Onodera, K.(Okinawa Health Biotechnology Research Development Center, Uruma (Japan)), Hanashiro, K, Yasumoto, T

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