Statistics and methodology of multiple cell upset characterization under heavy ion irradiation by Zebrev, G.I., Gorbunov, M.S., Useinov, R.G., Emeliyanov, V.V., Ozerov, A.I., Anashin, V.S., Kozyukov, A.E., Zemtsov, K.S.

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Analytical Model of Radiation Induced or Single Event Latchup in CMOS Integrated Circuits by Useinov, R.G.

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Reversible positive charge annealing in MOS transistor during variety of electrical and thermal stresses by Emelianov, V.V., Zebrev, G.I., Ulimov, V.N., Useinov, R.G., Belyakov, V.V., Pershenkov, V.S.

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Extreme Value Based Estimation of Critical Single Event Failure Probability by Zebrev, G I, Galimov, A M, Useinov, R G, Fateev, I A

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Analytical Model of Radiation Induced or Single Event Latchup in CMOS Integrated Circuits by Useinov, R.G.

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Multiple Cell Upset Cross-Section Uncertainty in Nanoscale Memories: Microdosimetric Approach by Zebrev, G I, Zemtsov, K S, Useinov, R G, Gorbunov, M S, Emeliyanov, V V, Ozerov, A I

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Methodology of soft error rate computation in modern microelectronics by Zebrev, G. I., Ishutin, I. O., Useinov, R. G., Anashin, V. S.

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Analysis of SOI CMOS microprocessor's SEE sensitivity: Correlation of the results obtained by different test methods by Gorbunov, M. S., Vasilegin, B. V., Antonov, A. A., Osipenko, P. N., Zebrev, G. I., Anashin, V. S., Emeliyanov, V. V., Ozerov, A. I., Useinov, R. G., Chumakov, A. I., Pechenkin, A. A., Yanenko, A. V.

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Physical model of single heavy ION induced hard errors by Useinov, R.G., Zebrev, G.I., Emelianov, V.V., Persbenkov, V.S., Ulimov, V.N.

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Degeneracy multiplicity of the states of two-charge acceptors in semiconductors by Shtivel'man, K. Ya, Useinov, R. G.

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Radiation response of MOSFET's parameters as a function of measurement temperature by Belyakov, V.V., Zebrev, G.I., Shvetzov-Shilovsky, I.N., Useinov, R.G.

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Tunneling magnetoresistance in ferromagnetic planar hetero-nanojunctions by Useinov, A. N., Deminov, R. G., Useinov, N. Kh, Tagirov, L. R.

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Giant magnetoresistance in nanoscale ferromagnetic heterocontacts by Useinov, A N, Deminov, R G, Tagirov, L R, Pan, G

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Tunneling magnetoresistance in ferromagnetic planar hetero-nanojunctions: TMR in ferromagnetic planar hetero-nanojunctions by Useinov, A. N., Deminov, R. G., Useinov, N. Kh, Tagirov, L. R.

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Magnetic and superconducting heterostructures in spintronics by Deminov, R G, N. Kh. Useinov, Tagirov, L R

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Mean-free path effects in magnetoresistance of ferromagnetic nanocontacts by Useinov, A. N., Tagirov, L. R., Deminov, R. G., Zhou, Y., Pan, G.

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Tunneling magnetoresistance in ferromagnetic planar hetero-nanojunctions by USEINOV, A. N, DEMINOV, R. G, USEINOV, N. Kh, TAGIROV, L. R

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Giant magnetoresistance in nanoscale ferromagnetic heterocontacts by USEINOV, A. N, DEMINOV, R. G, TAGIROV, L. R, PAN, G

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Mean-free path effects in magnetoresistance of ferromagnetic nanocontacts by USEINOV, A. N, TAGIROV, L. R, DEMINOV, R. G, ZHOU, Y, PAN, G

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Giant magnetoresistance in nanoscale ferromagnetic heterocontacts by Useinov, A N, Deminov, R G, Tagirov, L R, Pan, G

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