Search Results - Uzun, Talip

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    Identification of intrinsic deep level defects responsible for electret behavior in TlGaSe2 layered semiconductor

    Identification of intrinsic deep level defects responsible for electret behavior in TlGaSe2 layered semiconductor by Seyidov, MirHasan Yu, Mikailzade, Faik A., Uzun, Talip, Odrinsky, Andrei P., Yakar, Emin, Aliyeva, Vafa B., Babayev, Sardar S., Mammadov, Tofig G.

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