The pattern of mycobacterial antigen recognition in sera from Mantoux‐negative individuals is essentially unaffected by bacilli Calmette‐Guérin (BCG) vaccination in either South In... by DAS, S., CHENG, S. H., LOWRIE, D. B., WALKER, K. B., MITCHISON, D. A., VALLISHAYEE, R. S., NARAYANAN, P. R.

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The pattern of mycobacterial antigen recognition in sera from Mantoux-negative individuals is essentially unaffected by bacille Calmette-Guérin (BCG) vaccination in either south In... by Das, S, Cheng, S H, Lowrie, D B, Walker, K B, Mitchison, D A, Vallishayee, R S, Narayanan, P R

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Non-fermenting Gram Negative Bacilli Associated with Acute Respiratory Infections in Children in Madras by Paramasivan, C. N., Sivadasan, K., Datta, Manjula, Vallishayee, R. S., Prabhakar, R.

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Tuberculin sensitivity and skin lesions in children after vaccination with 11 different BCG strains by Vallishayee, R S, Shashidhara, A N, Bunch-Christensen, K, Guld, J

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The pattern of mycobacterial antigen recognition in sera from Mantoux-negative individuals is essentially unaffected by bacille Calmette-Guérin (BCG) vaccintin in either South Indi... by DAS, S, CHENG, S. H, LOWRIE, D. B, WALKER, K. B, MITCHISON, D. A, VALLISHAYEE, R. S, NARAYANAN, P. R

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Methodology for modeling the effects of systematic within-die interconnect and device variation on circuit performance by Mehrotra, Vikas, Sam, Shiou Lin, Boning, Duane, Chandrakasan, Anantha, Vallishayee, Rakesh, Nassif, Sani

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Product relevant device leakage scribe characterization vehicle test chip for efficient full wafer testing by Hess, C., Firu, R., Vallishayee, R., Shia Yu, Peng Zhao, Sa Zhao

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Extension of the boundary element method to systems with conductors and piece-wise constant dielectrics by Vallishayee, R.R., Cho, D.D.

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Estimating MOSFET Leakage from Low-cost, Low-resolution Fast Parametric Test by Saxena, S., Uezono, T., Vallishayee, R., Lindley, R., Swimmer, A., Winters, S.

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Method for Fast and Accurate Calibration of Litho Simulator for Hot Spot Analysis by Jank, S., Temchenko, V., Karakatsanis, P.G., Veerasingam, R., Vallishayee, R., Dolainsky, C., Xiaojing Yang, Nehmadi, Y., Poyastro, M.

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Manufacturability of Electronic Chips by Vallishayee, Rakesh R, Orszag, Steven A, Jackson, Eric, Barouch, Eytan

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On the impact of dishing in metal CMP processes on circuit performance by Stine, B.E., Vallishayee, R.

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Predictive yield modeling for reconfigurable memory circuits by Ciplickas, D.J., Li, X., Vallishayee, R., Strojwas, A., Williams, R., Renfro, M., Nurani, R.

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