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Search Results - VAN LUPPEN, J
Search Results - VAN LUPPEN, J
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PEDOT/PSS: synthesis, characterization, properties and applications
by
Louwet, F.
,
Groenendaal, L.
,
Dhaen, J.
,
Manca, J.
,
Van Luppen, J.
,
Verdonck, E.
,
Leenders, L.
Published in
Synthetic metals
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Ultra-low-angle microtomy to back up S-SIMS molecular depth profiling with C60+ and Bin+ for the nanoscale analysis of high-tech industrial materials
by
De Mondt, R.
,
Vercammen, Y.
,
Dardenne, R.
,
Vangaever, F.
,
Van Luppen, J.
,
Van Vaeck, L.
Published in
Surface and interface analysis
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Ultra‐low‐angle microtomy to back up S‐SIMS molecular depth profiling with C 60 + and Bi n + for the nanoscale analysis of high‐tech industrial materials
by
De Mondt, R.
,
Vercammen, Y.
,
Dardenne, R.
,
Vangaever, F.
,
Van Luppen, J.
,
Van Vaeck, L.
Published in
Surface and interface analysis
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Feasibility of static secondary ion mass spectrometry to study physicochemical interactions between organic components and silver in thermographic systems
by
De Mondt, Roel
,
Van Vaeck, Luc
,
Lenaerts, Jens
,
Geuens, Ingrid
,
Van Luppen, Jaymes
Published in
Rapid communications in mass spectrometry
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Comparison of mono- and polyatomic primary ions for the characterization of organic dye overlayers with static secondary ion mass spectrometry
by
Lenaerts, Jens
,
Vaeck, Luc Van
,
Gijbels, Renaat
,
Luppen, Jaymes Van
Published in
Rapid communications in mass spectrometry
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PEDOT/PSS: synthesis, characterization, properties and applications
by
LOUWET, F
,
GROENENDAAL, L
,
DHAEN, J
,
MANCA, J
,
VAN LUPPEN, J
,
VERDONCK, E
,
LEENDERS, L
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Rapid Communications In Mass Spectrometry
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Surface And Interface Analysis
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Synthetic Metals
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Atomic, Molecular, And Ion Beam Impact And Interactions With Surfaces
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