Search Results - VAN VONNO, N. W

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  1. 1
    Combined Displacement Damage and LDR Results of the Intersil ISL73141SEH 3.3V Analog to Digital Converter

    Combined Displacement Damage and LDR Results of the Intersil ISL73141SEH 3.3V Analog to Digital Converter by Newman, W. H., Van Vonno, N.W., Michalski, C., Thornberry, D., Harris, J.M., Pearce, L. G.

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  2. 2
    Total Dose and SEE Testing of the ISL73847SEH Single/Dual Phase Current Mode PWM Controller

    Total Dose and SEE Testing of the ISL73847SEH Single/Dual Phase Current Mode PWM Controller by Van Vonno, N. W., Newman, W. H., Pearce, L. G., Thomson, E. J., Trang, Hy

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  3. 3
    Total Dose and Single-Event Effects Testing of the Intersil ISL73041SEH 12V Half Bridge GaN FET Driver

    Total Dose and Single-Event Effects Testing of the Intersil ISL73041SEH 12V Half Bridge GaN FET Driver by Campanella, M. L., Newman, W. H., Van Vonno, N.W., Wackley, D., Lok, T., Pearce, L. G., Thomson, E. J.

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  4. 4
    Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser

    Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser by Ren, Y., He, A.-L., Shi, S.-T., Guo, G., Chen, L., Wen, S.-J., Wong, R., van Vonno, N. W., Bhuva, B. L.

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  5. 5
    Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter

    Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter by Ren, Y., Fan, L., Chen, L., Wen, S.-J., Wong, R., van Vonno, N. W., Witulski, A. F., Bhuva, B. L.

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  6. 6
    Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller

    Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller by Ren, Y., Shi, S.-T., Chen, L., Wang, H.-B., Gao, L.-J., Guo, G., Wen, S.-J., Wong, R., van Vonno, N. W.

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  7. 7
    Combined Total Dose and Displacement Damage Testing of the ISL71831SEH 32-Channel Analog Multiplexer

    Combined Total Dose and Displacement Damage Testing of the ISL71831SEH 32-Channel Analog Multiplexer by Van Vonno, N. W., Newman, W.H., Pearce, L. G., Thomson, E. J., Campanella, M. L.

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  8. 8
    Combined Neutron and TID Results of the Intersil ISL70321SEH

    Combined Neutron and TID Results of the Intersil ISL70321SEH by Newman, W. H., van Vonno, N.W., Turner, S.D., Pearce, L. G.

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  9. 9
    Total Dose and Single Event Testing of a Hardened Single-Ended Current Mode PWM Controller

    Total Dose and Single Event Testing of a Hardened Single-Ended Current Mode PWM Controller by van Vonno, N W, Pearce, L G, Wood, G M, White, J D, Thomson, E J, Bernard, T M, Chesley, P J, Hood, R

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  10. 10
    Total Dose and Single-Event Effects Testing of the Intersil ISL70321SEH Power Supply Sequencer

    Total Dose and Single-Event Effects Testing of the Intersil ISL70321SEH Power Supply Sequencer by van Vonno, N. W., Mansilla, O., Turner, S. D., Newman, W. H., Pearce, L. G., Thomson, E. J.

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  11. 11
    A Radiation Hardened, High-Voltage, High-Precision Analog Family

    A Radiation Hardened, High-Voltage, High-Precision Analog Family by Newman, W. H., van Vonno, N. W., Mansilla, O., Pearce, L. G., Thomson, E. J.

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  12. 12
    Total Dose and Single-Event Effects Testing of the Intersil ISL70591SEH and ISL70592SEH Current Sources

    Total Dose and Single-Event Effects Testing of the Intersil ISL70591SEH and ISL70592SEH Current Sources by Newman, W. H., van Vonno, N. W., Williams, B., Robinson, A., Mansilla, O., Turner, S. D., Pearce, L. G., Thomson, E. J.

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  13. 13
    Displacement Damage Testing of the Intersil ISL70023SEH and ISL70024SEH Gallium Nitride Power Transistors

    Displacement Damage Testing of the Intersil ISL70023SEH and ISL70024SEH Gallium Nitride Power Transistors by van Vonno, N. W., Mansilla, O., Gill, J. S., Newman, W. H., Pearce, L. G., Thomson, E. J.

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  14. 14
    Destructive Single-Event Effects Testing of the Intersil ISL70023SEH and ISL70024SEH Gallium Nitride power transistors

    Destructive Single-Event Effects Testing of the Intersil ISL70023SEH and ISL70024SEH Gallium Nitride power transistors by van Vonno, N. W., Mansilla, O., Gill, J. S., Newman, W. H., Pearce, L. G., Thomson, E. J.

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  15. 15
    Design considerations and verification testing of an SEE-hardened quad comparator

    Design considerations and verification testing of an SEE-hardened quad comparator by van Onno, N.W., Doyle, B.R.

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  16. 16
    Displacement Damage Testing Results for Intersil Bipolar and BiCMOS Analog Parts

    Displacement Damage Testing Results for Intersil Bipolar and BiCMOS Analog Parts by van Vonno, N. W., Shick, J. E., Traynham, P. W., Ballou, F. C., Gill, J. S.

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  17. 17
    Total Dose and Single Event Effects Testing of the Intersil ISL70444SEH Hardened Operational Amplifier

    Total Dose and Single Event Effects Testing of the Intersil ISL70444SEH Hardened Operational Amplifier by van Vonno, N. W., Williams, B., Hood, R., Thomson, E. J., Bernard, S. K.

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  18. 18
    Total Dose and Single Event Effects Testing of the Intersil ISL71090SEH and ISL71091SEH Precision Voltage References

    Total Dose and Single Event Effects Testing of the Intersil ISL71090SEH and ISL71091SEH Precision Voltage References by van Vonno, N. W., Williams, B., Turner, S. D., Thomson, E. J., Bernard, S. K., Goodhew, D. N.

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  19. 19
    Results of Displacement Damage Testing of the Intersil ISL70227SRH Dual Operational Amplifier

    Results of Displacement Damage Testing of the Intersil ISL70227SRH Dual Operational Amplifier by van Vonno, N. W., Hood, R. A., Mansilla, O., Thomson, E. J., Ballou, F. C.

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  20. 20
    Rebound Testing of Intersil Bipolar and BiCMOS Parts

    Rebound Testing of Intersil Bipolar and BiCMOS Parts by van Vonno, N. W., Knudsen, K., Hood, R., Mansilla, O., Bernard, T. M., Chesley, P. J.

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