Search Results - VIEUJOT-TESTEMALE, E

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    Work function measurements during growth of ultra thin films of SiO2 on characterized silicon surfaces

    Work function measurements during growth of ultra thin films of SiO2 on characterized silicon surfaces by RAISIN, C, VIEUJOT-TESTEMALE, E, BEN BRAHIM, A, PALAU, J. M, LASSABATERE, L

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    Properties of the contact on ion cleaned n and p type silicon surfaces

    Properties of the contact on ion cleaned n and p type silicon surfaces by Vieujot-Testemale, E., Palau, J.M., Ismail, A., Lassabatere, L.

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    Work function measurements during growth of ultra thin films of SiO 2 on characterized silicon surfaces

    Work function measurements during growth of ultra thin films of SiO 2 on characterized silicon surfaces by Raisin, C., Vieujot-Testemale, E., Brahim, A.Ben, Palau, J.M., Lassabatere, L.

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