Search Results - Vaenkatesan, V

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  1. 1
    Sub-50 nm metrology on extreme ultra violet chemically amplified resist--A systematic assessment

    Sub-50 nm metrology on extreme ultra violet chemically amplified resist--A systematic assessment by Maas, D J, Fliervoet, T, Herfst, R, van Veldhoven, E, Meessen, J, Vaenkatesan, V, Sadeghian, H

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  2. 2
    Improving the Brightness and Daylight Contrast of Organic Light-Emitting Diodes

    Improving the Brightness and Daylight Contrast of Organic Light-Emitting Diodes by Vaenkatesan, V., Wegh, R. T., Teunissen, J.-P., Lub, J., Bastiaansen, C. W. M., Broer, D. J.

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