Search Results - Vaion, R. E.

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  1. 1
    Drain stress influence on read disturb defectivity

    Drain stress influence on read disturb defectivity by De Tomasi, M., Vaion, R. E., Cola, L., Zabberoni, P., Mervic, A.

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  2. 2
    Read disturb on flash memories: Study on temperature annealing effect

    Read disturb on flash memories: Study on temperature annealing effect by Cola, L., De Tomasi, M., Enrici Vaion, R., Mervic, A., Zabberoni, P.

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    Robust automotive products in advanced CMOS nodes

    Robust automotive products in advanced CMOS nodes by Huard, V., Mhira, S., De Tomasi, M., Trabace, E., Vaion, R. Enrici, Zabberoni, P.

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