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Determination of structural parameters of the Fe-Si-system by spectral ellipsometry method
by
Lyaschenko, S.A.
,
Varnakov, S.N.
,
Ovchinnikov, S.G.
,
Berezitskaya, E.P.
,
Alexandrova, G.A.
,
Vaituzin, O.P.
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Conference Proceedings
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Atomic Force Microscopic
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Materials Science
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Materials Science, Multidisciplinary
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Silicides
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Spectral Ellipsometry
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