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On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST)
by
Mozaffari, Seyed Nima
,
Bhaskaran, Bonita
,
Sarangi, Shantanu
,
Satheesh, Suhas
,
Fu, Kuo Lin
,
Valentine, Nithin
,
Manikandan, P
,
Yilmaz, Mahmut
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At-speed capture global noise reduction & low-power memory test architecture
by
Bhaskaran, Bonita
,
Chadalavada, Sailendra
,
Sarangi, Shantanu
,
Valentine, Nithin
,
Nerallapally, Venkat Abilash Reddy
,
Abdollahian, Ayub
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Discrete Fourier Transforms
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