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Search Results - Van Dael, Mattias
Search Results - Van Dael, Mattias
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Building 3D Statistical Shape Models of Horticultural Products
by
Danckaers, Femke
,
Huysmans, Toon
,
Dael, Mattias Van
,
Verboven, Pieter
,
Nicolaï, Bart
,
Sijbers, Jan
Published in
Food and bioprocess technology
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Spatial development of transport structures in apple (Malus × domestica Borkh.) fruit
by
Herremans, Els
,
Verboven, Pieter
,
Hertog, Maarten L A T M
,
Cantre, Dennis
,
van Dael, Mattias
,
De Schryver, Thomas
,
Van Hoorebeke, Luc
,
Nicolaï, Bart M
Published in
Frontiers in plant science
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Inline discrete tomography system: Application to agricultural product inspection
by
Alves Pereira, Luis F.
,
Janssens, Eline
,
Cavalcanti, George D.C.
,
Tsang, Ing Ren
,
Van Dael, Mattias
,
Verboven, Pieter
,
Nicolai, Bart
,
Sijbers, Jan
Published in
Computers and electronics in agriculture
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Online Tomato Inspection Using X-Ray Radiographies and 3- Dimensional Shape Models
by
M. Van Dael
,
S. Rogge
,
P. Verboven
,
W. Saeys
,
J. Sijbers
,
B. Nicolai
Published in
Chemical engineering transactions
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Assessment of bruise volumes in apples using X-ray computed tomography
by
Diels, Elien
,
van Dael, Mattias
,
Keresztes, Janos
,
Vanmaercke, Simon
,
Verboven, Pieter
,
Nicolai, Bart
,
Saeys, Wouter
,
Ramon, Herman
,
Smeets, Bart
Published in
Postharvest biology and technology
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To disinfect or not to disinfect in postharvest research on the fungal decay of apple?
by
Naets, Matthias
,
van Dael, Mattias
,
Vanstreels, Els
,
Daelemans, Dirk
,
Verboven, Pieter
,
Nicolaï, Bart
,
Keulemans, Wannes
,
Geeraerd, Annemie
Published in
International journal of food microbiology
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Neural network Hilbert transform based filtered backprojection for fast inline x-ray inspection
by
Janssens, Eline
,
De Beenhouwer, Jan
,
Van Dael, Mattias
,
De Schryver, Thomas
,
Van Hoorebeke, Luc
,
Verboven, Pieter
,
Nicolai, Bart
,
Sijbers, Jan
Published in
Measurement science & technology
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In-line NDT with X-Ray CT combining sample rotation and translation
by
De Schryver, Thomas
,
Dhaene, Jelle
,
Dierick, Manuel
,
Boone, Matthieu N.
,
Janssens, Eline
,
Sijbers, Jan
,
van Dael, Mattias
,
Verboven, Pieter
,
Nicolai, Bart
,
Van Hoorebeke, Luc
Published in
NDT & E international : independent nondestructive testing and evaluation
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Building a Statistical Shape Model of the Apple from Corresponded Surfaces
by
F. Danckaers
,
T. Huysmans
,
M. Van Dael
,
P. Verboven
,
B. Nicolai
,
J. Sijbers
Published in
Chemical engineering transactions
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Fast inline inspection by Neural Network Based Filtered Backprojection: Application to apple inspection
by
Janssens, Eline
,
Alves Pereira, Luis F.
,
De Beenhouwer, Jan
,
Tsang, Ing Ren
,
Van Dael, Mattias
,
Verboven, Pieter
,
Nicolaï, Bart
,
Sijbers, Jan
Published in
Case studies in nondestructive testing and evaluation
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Fast Neural Network Based X-Ray Tomography of Fruit on a Conveyor Belt
by
E. Janssens
,
D. Pelt
,
J. De Beenhouwer
,
M. Van Dael
,
P. Verboven
,
B. Nicolai
,
J. Sijbers
Published in
Chemical engineering transactions
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