Search Results - Van Hoeymissen, J.A.B.

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    Analysis of trace metals in thin silicon nitride films by total-reflection X-ray fluorescence

    Analysis of trace metals in thin silicon nitride films by total-reflection X-ray fluorescence by Vereecke, G., Arnauts, S., Van Doorne, P., Kenis, K., Onsia, B., Verstraeten, K., Schaekers, M., Van Hoeymissen, J.A.B., Heyns, M.M.

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    Electrocoagulation as a viable technique to treat (Cu-)CMP wastes

    Electrocoagulation as a viable technique to treat (Cu-)CMP wastes by Van Hoeymissen, J.A.B., Van den Broeck, K., Van Hoornick, N., Heyns, M.

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    In situ HDP-CVD process diagnostics based on quadrupole mass spectrometry

    In situ HDP-CVD process diagnostics based on quadrupole mass spectrometry by Hughes, C., Van Hoeymissen, J.A.B., Heyns, M.

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