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Search Results - VanLeyen, Dieter
Search Results - VanLeyen, Dieter
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Time-of-flight secondary ion mass spectrometry of polymers in the mass range 500-10000
by
Bletsos, Ioannis V
,
Hercules, David M
,
VanLeyen, Dieter
,
Benninghoven, Alfred
Published in
Macromolecules
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Determination of molecular weight and composition of a perfluorinated polymer from fragment intensities in time-of-flight secondary ion mass spectrometry
by
Fowler, David E
,
Johnson, Robert D
,
VanLeyen, Dieter
,
Benninghoven, Alfred
Published in
Analytical chemistry (Washington)
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Time-of-flight secondary ion mass spectrometry of perfluorinated polyethers
by
Bletsos, Ioannis V
,
Hercules, David M
,
VanLeyen, Dieter
,
Benninghoven, Alfred
,
Fowler, David
Published in
Analytical chemistry (Washington)
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Structural characterization of model polyester polyurethanes using time-of-flight secondary ion mass spectrometry
by
Bletsos, Ioannis V
,
Hercules, David M
,
VanLeyen, Dieter
,
Benninghoven, Alfred
,
Karakatsanis, Costas G
,
Rieck, James N
Published in
Macromolecules
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Structural characterization of model polyurethanes using time-of-flight secondary ion mass spectrometry
by
Bletsos, Ioannis V
,
Hercules, David M
,
VanLeyen, Dieter
,
Benninghoven, Alfred
,
Karakatsanis, Costas G
,
Rieck, James N
Published in
Analytical chemistry (Washington)
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Time-of-flight secondary ion mass spectrometry: detection of fragments from thick polymer films in the range m/z .ltoreq. 4500
by
Bletsos, Ioannis V
,
Hercules, David M
,
Magill, Joseph H
,
VanLeyen, Dieter
,
Niehuis, Ewald
,
Benninghoven, Alfred
Published in
Analytical chemistry (Washington)
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Time-of-flight secondary ion mass spectrometry of polymers in the mass range 500-10 000
by
BLETSOS, I. V
,
HERCULES, D. M
,
VAN LEYEN, D
,
BENNINGHOVEN, A
Published in
Macromolecules
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Quantitative time-of-flight secondary ion mass spectrometry of a perfluorinated polyether
by
Fowler, David E.
,
Johnson, Roboert D.
,
Vanleyen, Dieter
,
Benninghoven, Alfred
Published in
Surface and interface analysis
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Time-of-flight secondary ion mass spectrometry: detection of fragments from thick polymer films in the range m/z≤4500
by
BLETSON, I. V
,
HERCULES, D. M
,
MAGILL, J. H
,
VAN LEYEN, D
,
NIEHUIS, E
,
BENNINGHOVEN, A
Published in
Analytical chemistry (Washington)
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Molecular weight distributions of polymers using time-of-flight secondary-ion mass spectrometry
by
Bletsos, Ioannis V
,
Hercules, David M
,
Van Leyen, Dieter
,
Hagenhoff, Birgit
,
Niehuis, Ewald
,
Benninghoven, Alfred
Published in
Analytical chemistry (Washington)
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