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Search Results - Vanamurthy, Lakshmanan
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Cu penetration into low-k dielectric during deposition and bias-temperature stress
by
He, Ming
,
Novak, Steven
,
Vanamurthy, Lakshmanan
,
Bakhru, Hassaram
,
Plawsky, Joel
,
Lu, Toh-Ming
Published in
Applied physics letters
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Origin of highly spatially selective etching in deeply implanted complex oxides
by
Ofan, Avishai
,
Gaathon, Ophir
,
Vanamurthy, Lakshmanan
,
Bakhru, Sasha
,
Bakhru, Hassaram
,
Evans-Lutterodt, Kenneth
,
Osgood, Richard M.
Published in
Applied physics letters
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Subnanometer-resolution depth profiling of boron atoms and lattice defects in silicon ultrashallow junctions by ion beam techniques
by
Vanamurthy, Lakshmanan H.
,
Huang, Mengbing
,
Bakhru, Hassaram
,
Furukawa, Toshiharu
,
Berliner, Nathaniel
,
Herman, Joshua
,
Zhu, Zhengmao
,
Ronsheim, Paul
,
Doris, Bruce
Published in
Journal of vacuum science & technology. A, Vacuum, surfaces, and films
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Cu penetration into low- k dielectric during deposition andbias-temperature stress
by
He, Ming
,
Novak, Steven
,
Vanamurthy, Lakshmanan
,
Bakhru, Hassaram
,
Plawsky, Joel
,
Lu, Toh-Ming
Published in
Applied physics letters
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Fabrication of freestanding LiNbO3 thin films via He implantation and femtosecond laser ablation
by
Gaathon, Ophir
,
Ofan, Avishai
,
Dadap, Jerry I.
,
Vanamurthy, Lakshmanan
,
Bakhru, Sasha
,
Bakhru, Hassaram
,
Osgood, Richard M.
Published in
Journal of vacuum science & technology. A, Vacuum, surfaces, and films
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Fabrication of freestanding LiNbO 3 thin films via He implantation and femtosecond laser ablation
by
Gaathon, Ophir
,
Ofan, Avishai
,
Dadap, Jerry I.
,
Vanamurthy, Lakshmanan
,
Bakhru, Sasha
,
Bakhru, Hassaram
,
Osgood, Richard M.
Published in
Journal of vacuum science & technology. A, Vacuum, surfaces, and films
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Origin of highly spatially selective etching in deeply implantedcomplex oxides
by
Ofan, Avishai
,
Gaathon, Ophir
,
Vanamurthy, Lakshmanan
,
Bakhru, Sasha
,
Bakhru, Hassaram
,
Evans-Lutterodt, Kenneth
,
Osgood, Richard M.
Published in
Applied physics letters
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Application of ion beams in the study of depth profiling of nitrogen
by
Vanamurthy, Lakshmanan H.
,
Haberl, Arthur W.
,
Bakhru, Hassaram
Published in
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
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Thermal Stability Study of Pore Sealing Using Parylene N
by
Ou, Ya
,
Wang, Pei-I
,
Vanamurthy, Lakshmanan H.
,
Bakhru, Hassaram
,
Lu, T.-M.
,
Spencer, Greg
Published in
Journal of the Electrochemical Society
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Oxide heterogrowth on ion-exfoliated thin-film complex oxide substrates
by
Chen, Tsung-Liang
,
Kou, Angela
,
Ofan, Avishai
,
Gaathon, Ophir
,
Osgood, R.M.
,
Gang, Oleg
,
Vanamurthy, Lakshmanan
,
Bakhru, Sasha
,
Bakhru, Hassaram
Published in
Thin solid films
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Variation improvement for manufacturable FINFET technology
by
Pal, Rohit
,
Togo, Mitsuhiro
,
Yoong Yong
,
Vanamurthy, Lakshmanan
,
Muralidharan, Sruthi
,
Xing Zhang
,
Carter, Richard
,
Eller, Manfred
,
Samavedam, Srikanth
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