Search Results - Vandling, G.

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  1. 1
    On correlating structural tests with functional tests for speed binning of high performance design

    On correlating structural tests with functional tests for speed binning of high performance design by Zeng, J., Abadir, M., Vandling, G., Wang, L., Kolhatkar, A., Abraham, J.

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  2. 2
    Modeling and testing the Gekko microprocessor, an IBM PowerPC derivative for Nintendo

    Modeling and testing the Gekko microprocessor, an IBM PowerPC derivative for Nintendo by Vandling, G.

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  3. 3
    EDA solutions to new-defect detection in advanced process technologies

    EDA solutions to new-defect detection in advanced process technologies by Marinissen, E. J., Vandling, G., Goel, S. K., Hapke, F., Rivers, J., Mittermaier, N., Bahl, S.

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    On correlating structural tests with functional tests for speed binning of high performance design

    On correlating structural tests with functional tests for speed binning of high performance design by Zeng, J., Abadir, M.S., Vandling, G., Wang, L.-C., Karako, S., Abraham, J.A.

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  5. 5
    Fault model extension for diagnosing custom cell fails

    Fault model extension for diagnosing custom cell fails by Bartenstein, T., Vandling, G.

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  6. 6
    The Simplification of Multiple-Output Switching Networks Composed of Unilateral Devices

    The Simplification of Multiple-Output Switching Networks Composed of Unilateral Devices by Vandling, G. C.

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