Search Results - Vassighi, A.

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  1. 1
    Effect of CMOS technology scaling on thermal management during burn-in

    Effect of CMOS technology scaling on thermal management during burn-in by Semenov, O., Vassighi, A., Sachdev, M., Keshavarzi, A., Hawkins, C.F.

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  2. 2
    Thermal management of high performance microprocessors in burn-in environment

    Thermal management of high performance microprocessors in burn-in environment by Vassighi, A., Semenov, O., Sachdev, M., Keshavarzi, A.

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  3. 3
    Design optimizations for microprocessors at low temperature

    Design optimizations for microprocessors at low temperature by Vassighi, Arman, Keshavarzi, Ali, Narendra, Siva, Schrom, Gerhard, Ye, Yibin, Lee, Seri, Chrysler, Greg, Sachdev, Manoj, De, Vivek

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  4. 4
    Effect of static power dissipation in burn-in environment on yield of VLSI

    Effect of static power dissipation in burn-in environment on yield of VLSI by Vassighi, A., Semenov, O., Sachdev, M., Keshavarzi, A.

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  5. 5
    Burn-in temperature projections for deep sub-micron technologies

    Burn-in temperature projections for deep sub-micron technologies by Semenov, O., Vassighi, A., Sachdev, M., Keshavarzi, A., Hawkins, C.F.

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  6. 6
    Characterizing infant mortality in high volume manufacturing

    Characterizing infant mortality in high volume manufacturing by Vassighi, A., Kacprowicz, R., Carranza, C., Riordan, W.

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  7. 7
    Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta IDDQ Testing

    Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta IDDQ Testing by Semenov, Oleg, Vassighi, Arman, Sachdev, Manoj

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  8. 8
    Impact of self-heating effect on long-term reliability and performance degradation in CMOS circuits

    Impact of self-heating effect on long-term reliability and performance degradation in CMOS circuits by Semenov, O., Vassighi, A., Sachdev, M.

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  9. 9
    Thermal runaway in integrated circuits

    Thermal runaway in integrated circuits by Vassighi, A., Sachdev, M.

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  10. 10
    Impact of technology scaling on thermal behavior of leakage current in sub-quarter micron MOSFETs: perspective of low temperature current testing

    Impact of technology scaling on thermal behavior of leakage current in sub-quarter micron MOSFETs: perspective of low temperature current testing by Semenov, Oleg, Vassighi, Arman, Sachdev, Manoj

    Published in Microelectronics
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  11. 11
    CMOS IC technology scaling and its impact on burn-in

    CMOS IC technology scaling and its impact on burn-in by Vassighi, A., Semenov, O., Sachdev, M., Keshavarzi, A., Hawkins, C.

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  12. 12
    The current state of the quality of homeopathic clinical research

    The current state of the quality of homeopathic clinical research by Herman, Patricia M., Crawford, Cindy C., Maglione, Margaret A., Newberry, Sydne J., Amieux, Paul S., Blyden-Taylor, Kimberlee, Khorsan, Raheleh, Prenguber, Marcia, Rice, Elizabeth, Shollar, Andy, Tyson, Tiesha, Vassighi, Nazanin, Coulter, Ian D.

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