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Hydrogen passivation caused by “soft” sputter etch cleaning of Si
by
Vercaemst, A.S
,
Van Meirhaeghe, R.L
,
Laflere, W.H
,
Cardon, F
Published in
Solid-state electronics
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On the influence of sputter etch cleaning on the silicidation, the thermal stability and the electrical characteristics of Ti/ p−Si contacts
by
Vercaemst, A.S.
,
Van Meirhaeghe, R.L.
,
Laflère, W.H.
,
Cardon, F.
,
De Bosscher, W.
,
Schreutelkamp, R.J.
Published in
Solid State Electronics
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