Diffusion and relaxation of excess carriers in InGaN quantum wells in localized versus extended states by Vertikov, A., Ozden, I., Nurmikko, A. V.

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Recombination dynamics in InGaN quantum wells by Jeon, E. S., Kozlov, V., Song, Y.-K., Vertikov, A., Kuball, M., Nurmikko, A. V., Liu, H., Chen, C., Kern, R. S., Kuo, C. P., Craford, M. G.

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A vertical cavity light emitting InGaN quantum well heterostructure by Song, Y.-K., Zhou, H., Diagne, M., Ozden, I., Vertikov, A, Nurmikko, A. V., Carter-Coman, C., Kern, R. S., Kish, F. A., Krames, M. R.

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Role of localized and extended electronic states in InGaN/GaN quantum wells under high injection, inferred from near-field optical microscopy by Vertikov, A., Nurmikko, A. V., Doverspike, K., Bulman, G., Edmond, J.

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Near-field optical study of InGaN/GaN epitaxial layers and quantum wells by Vertikov, A., Kuball, M., Nurmikko, A. V., Chen, Y., Wang, S.-Y.

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Time-resolved pump-probe experiments with subwavelength lateral resolution by Vertikov, A., Kuball, M., Nurmikko, A. V., Maris, H. J.

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Investigation of excess carrier diffusion in nitride semiconductors with near-field optical microscopy by Vertikov, Andrey, Ozden, Ilker, Nurmikko, Arto V.

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Gain spectroscopy of excitonic molecules and its dynamics in a ZnSe single quantum well by Kozlov, V, V, Kelkar, P, Vertikov, A, Nurmikko, AV, Chu, C, Han, J, Hua, CG, Gunshor, RL

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Determination of electron-hole transport in InGaN QW heterostructures by near-field optical microscopy by Vertikov, A., Ozden, I., Nurnikko, A.V.

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Ultrafast nonequilibrium spin dynamics in a ferromagnetic thin film by Ganping Ju, Vertikov, A., Nurmikko, A.V., Farrow, R.F.C., Cebollada, A.

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Time-resolved pump-probe experiments with 0.1 micron resolution by Kuball, M., Vertikov, A., Nurmikko, A.V., Maris, H.J.

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Feasibility of combined optical coherence tomography and autofluorescence imaging for visualization of needle biopsy placement by Hohert, Geoffrey, Meyers, Renelle, Lam, Sylvia, Vertikov, Andrei, Lee, Anthony, Lam, Stephen, Lane, Pierre

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A technology of diagnosing and monitoring SF/sub 6/ insulation in a high-voltage GIS by Vertikov, V.P., Kuleshov, V.A.

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A technology of diagnosing and monitoring SF sub(6) insulation in a high-voltage GIS by Vertikov, V P, Kuleshov, V A

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