Search Results - Vižďa, František

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  1. 1
    Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model

    Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model by Ohlídal, Ivan, Vohánka, Jiří, Mistrík, Jan, Čermák, Martin, Vižd'a, František, Franta, Daniel

    Published in Thin solid films
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  2. 2
    Optical characterization of HfO2 thin films

    Optical characterization of HfO2 thin films by FRANTA, Daniel, OHLIDAL, Ivan, NECAS, David, VIZD'A, František, CAHA, Ondřej, HASON, Martin, PKORNY, Pavel

    Published in Thin solid films
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  3. 3
    Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry

    Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry by Nečas, David, Ohlídal, Ivan, Franta, Daniel, Čudek, Vladimír, Ohlídal, Miloslav, Vodák, Jiří, Sládková, Lucia, Zajíčková, Lenka, Eliáš, Marek, Vižďa, František

    Published in Thin solid films
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  4. 4
    Wide spectral range optical characterization of terbium gallium garnet (TGG) single crystal by universal dispersion model

    Wide spectral range optical characterization of terbium gallium garnet (TGG) single crystal by universal dispersion model by Franta, Daniel, Mureșan, Mihai-George, Ondračka, Pavel, Hroncová, Beáta, Vižďa, František

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  5. 5
    Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory

    Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory by Šulc, Václav, Vohánka, Jiří, Ohlídal, Ivan, Klapetek, Petr, Ohlídal, Miloslav, Kaur, Nupinder Jeet, Vižďa, František

    Published in Coatings (Basel)
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  6. 6
    Comparison of dispersion models in the optical characterization of As–S chalcogenide thin films

    Comparison of dispersion models in the optical characterization of As–S chalcogenide thin films by Ohlídal, Ivan, Franta, Daniel, Šiler, Martin, Vižd’a, František, Frumar, Miloslav, Jedelský, Jaroslav, Omasta, Jaroslav

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  7. 7
    Optical characterization of HfO 2 thin films

    Optical characterization of HfO 2 thin films by Franta, Daniel, Ohlídal, Ivan, Nečas, David, Vižd'a, František, Caha, Ondřej, Hasoň, Martin, Pokorný, Pavel

    Published in Thin solid films
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  8. 8
    Optical quantities of multilayer systems with correlated randomly rough boundaries

    Optical quantities of multilayer systems with correlated randomly rough boundaries by OHLIDAL, I, VIZDA, F

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  9. 9
    Influence of Cross-Correlation of Rough Boundaries on Reflectance of Thin Films on GaAs and Si Substrates

    Influence of Cross-Correlation of Rough Boundaries on Reflectance of Thin Films on GaAs and Si Substrates by Vizd'a, Frantisek, Ohlidal, Ivan, Hruby, Vojtech

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  10. 10
    New technique of measurement of optical parameters of thin films

    New technique of measurement of optical parameters of thin films by Hlávka, Jan, Ohlídal, Ivan, Vižd'a, František, Sitter, Helmut

    Published in Thin solid films
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  11. 11
    Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries

    Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries by Ohlidal, Ivan, Vizd'a, Frantisek, Ohlidal, Miloslav

    Published in Optical Engineering
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