Tracer study of pore initiation in anodic alumina formed in phosphoric acid by Baron-Wiecheć, A., Burke, M.G., Hashimoto, T., Liu, H., Skeldon, P., Thompson, G.E., Habazaki, H., Ganem, J.-J., Vickridge, I.C.

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Limiting step involved in the thermal growth of silicon oxide films on silicon carbide by Vickridge, I C, Trimaille, I, Ganem, J-J, Rigo, S, Radtke, C, Baumvol, I J R, Stedile, F C

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Porous Anodic Alumina Growth in Borax Electrolyte by Baron-Wiecheć, A., Skeldon, P., Ganem, J. J., Vickridge, I. C., Thompson, G. E.

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Direct measurement of molecular breakup dynamics and vicinage effect of swift proton clusters using narrow nuclear resonance profiling by L’Hoir, A., Ganem, J.J., Trimaille, I., Vickridge, I.C.

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Oxygen isotopic exchange occurring during dry thermal oxidation of 6H SiC by Vickridge, I.C., Tromson, D., Trimaille, I., Ganem, J.-J., Szilágyi, E., Battistig, G.

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Polarity dependent carbon enrichment on 6H–SiC{ [formula omitted]} due to low energy ion bombardment by Battistig, G, Lábár, J.L, Gurbán, S, Sulyok, A, Menyhard, M, Vickridge, I.C, Szilagyi, E, Malherbe, J, Odendaal, Q

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Film growth and alloy enrichment during anodizing AZ31 magnesium alloy in fluoride/glycerol electrolytes of a range of water contents by Němcová, A., Galal, O., Skeldon, P., Kuběna, I., Šmíd, M., Briand, E., Vickridge, I., Ganem, J-J., Habazaki, H.

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Study of thin hafnium oxides deposited by atomic layer deposition by Ganem, J.-J., Trimaille, I., Vickridge, I.C., Blin, D., Martin, F.

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High dose He implantation in two Ti alloys: Effects on structure and thermal oxidation by Vickridge, I.C., Johnson, P.B., Gilberd, P.W., Morrison, Y.

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TEM and IBA study of the thermal oxidation of V following high dose He implantation by Gilberd, P.W, Johnson, P.B, Vickridge, I.C, Wismayer, A.C

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[sup 18]O Tracer Study of Porous Film Growth on Aluminum in Phosphoric Acid by Baron-Wiecheć, A., Ganem, J. J., Garcia-Vergara, S. J., Skeldon, P., Thompson, G. E., Vickridge, I. C.

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The contribution of stable isotopic tracing, narrow nuclear resonance depth profiling, and a simple stochastic theory of charged particle energy loss to studies of the dry thermal... by Vickridge, I.C., Ganem, J.J., Trimaille, I., Cantin, J.-L.

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Depth resolution and narrow nuclear resonance profiling by Vickridge, I.C.

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Vicinage effect for hydrogen clusters in Si3N4 and SiO2 by L'Hoir, A., Cohen, C., Ganem, J. J., Trimaille, Isabelle, Vickridge, I. C., Shubeita, S. M.

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Oxygen isotopic tracing study of the dry thermal oxidation of 6H SiC by Vickridge, I.C., Ganem, J.-J., Battistig, G., Szilagyi, E.

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Lithium and boron distributions in geological samples by Trompetter, W.J., Reyes, A.G., Vickridge, I.C., Markwitz, A.

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Formation of modified Si/SiO2 interfaces with intrinsic low defect concentrations by Gosset, L. G., Ganem, J. J., von Bardeleben, H. J., Rigo, S., Trimaille, I., Cantin, J. L., Åkermark, T., Vickridge, I. C.

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Narrow resonance profiling study of the oxidation of reactively sputtered Ti1−xAlxN thin films by Hugon, M.C, Desvignes, J.M, Agius, B, Vickridge, I.C, Kim, D.J, Kingon, A.I

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Electronic energy loss at zero atomic impact parameter: its importance for the Lewis effect and narrow nuclear resonance depth profiling by Vickridge, I.C., Amsel, G.

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The structure and oxidation of highly cavitated metal surfaces: a study based on TEM and Raman spectroscopy by Gilberd, P.W., Johnson, P.B., Vickridge, I.C.

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