Tracer study of pore initiation in anodic alumina formed in phosphoric acid by Baron-Wiecheć, A., Burke, M.G., Hashimoto, T., Liu, H., Skeldon, P., Thompson, G.E., Habazaki, H., Ganem, J.-J., Vickridge, I.C.

Get full text

Direct measurement of molecular breakup dynamics and vicinage effect of swift proton clusters using narrow nuclear resonance profiling by L’Hoir, A., Ganem, J.J., Trimaille, I., Vickridge, I.C.

Get full text

The structure and oxidation of highly cavitated metal surfaces: a study based on TEM and Raman spectroscopy by Gilberd, P.W., Johnson, P.B., Vickridge, I.C.

Get full text

Study of thin hafnium oxides deposited by atomic layer deposition by Ganem, J.-J., Trimaille, I., Vickridge, I.C., Blin, D., Martin, F.

Get full text

Thermal ammonia nitridation on HfO2 and hafnium silicates thin films by Ganem, J.-J., Trimaille, I., Vickridge, I.C., Gusev, E.P.

Get full text

The contribution of stable isotopic tracing, narrow nuclear resonance depth profiling, and a simple stochastic theory of charged particle energy loss to studies of the dry thermal... by Vickridge, I.C., Ganem, J.J., Trimaille, I., Cantin, J.-L.

Get full text

Depth resolution and narrow nuclear resonance profiling by Vickridge, I.C.

Get full text

Oxygen isotopic exchange occurring during dry thermal oxidation of 6H SiC by Vickridge, I.C., Tromson, D., Trimaille, I., Ganem, J.-J., Szilágyi, E., Battistig, G.

Get full text

Polarity dependent carbon enrichment on 6H–SiC{ [formula omitted]} due to low energy ion bombardment by Battistig, G, Lábár, J.L, Gurbán, S, Sulyok, A, Menyhard, M, Vickridge, I.C, Szilagyi, E, Malherbe, J, Odendaal, Q

Get full text

Thermal growth of SiO2 on SiC investigated by isotopic tracing and subnanometric depth profiling by Radtke, C, Baumvol, I.J.R, Stedile, F.C, Vickridge, I.C, Trimaille, I, Ganem, J.-J, Rigo, S

Get full text

Oxygen isotopic tracing study of the dry thermal oxidation of 6H SiC by Vickridge, I.C., Ganem, J.-J., Battistig, G., Szilagyi, E.

Get full text

Lithium and boron distributions in geological samples by Trompetter, W.J., Reyes, A.G., Vickridge, I.C., Markwitz, A.

Get full text

Silicon isotopic tracing with the 29Si(p, γ) narrow resonance near 415 keV by Vickridge, I.C., Kaitasov, O., Chater, R.J., Kilner, J.A.

Get full text

Narrow resonance profiling study of the oxidation of reactively sputtered Ti1−xAlxN thin films by Hugon, M.C, Desvignes, J.M, Agius, B, Vickridge, I.C, Kim, D.J, Kingon, A.I

Get full text

15N(d,α 0) 13C cross section and angular distribution measurements for ion beam analysis by Vickridge, I.C., Trompetter, W.J., Coote, G.E.

Get full text

Narrow resonance profiling study of the oxidation of reactively sputtered Ti 1− xAl xN thin films by Hugon, M.C, Desvignes, J.M, Agius, B, Vickridge, I.C, Kim, D.J, Kingon, A.I

Get full text

Electronic energy loss at zero atomic impact parameter: its importance for the Lewis effect and narrow nuclear resonance depth profiling by Vickridge, I.C., Amsel, G.

Get full text

Twenty years of proton microprobe research in biominerals by Coote (posthumously), G.E, Gauldie, R.W, Trompetter, W.J, Vickridge, I.C, Markwitz, A

Get full text

High dose He implantation in two Ti alloys: Effects on structure and thermal oxidation by Vickridge, I.C., Johnson, P.B., Gilberd, P.W., Morrison, Y.

Get full text

16O DIGME of high Tc materials by Vickridge, I.C., Tallon, J., Presland, M.

Get full text