Search Results - Villarrubia, John

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  1. 1
    Conventional vs. model-based measurement of patterned line widths from scanning electron microscopy profiles

    Conventional vs. model-based measurement of patterned line widths from scanning electron microscopy profiles by Salvat-Pujol, Francesc, Villarrubia, John S.

    Published in Ultramicroscopy
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  2. 2
    Probing Electrified Liquid–Solid Interfaces with Scanning Electron Microscopy

    Probing Electrified Liquid–Solid Interfaces with Scanning Electron Microscopy by Guo, Hongxuan, Yulaev, Alexander, Strelcov, Evgheni, Tselev, Alexander, Arble, Christopher, Vladar, Andras E, Villarrubia, John S, Kolmakov, Andrei

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  3. 3
    Unmasking the Resolution–Throughput Tradespace of Focused‐Ion‐Beam Machining

    Unmasking the Resolution–Throughput Tradespace of Focused‐Ion‐Beam Machining by Madison, Andrew C., Villarrubia, John S., Liao, Kuo‐Tang, Copeland, Craig R., Schumacher, Joshua, Siebein, Kerry, Ilic, B. Robert, Liddle, J. Alexander, Stavis, Samuel M.

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  4. 4
    Unmasking the Resolution–Throughput Tradespace of Focused‐Ion‐Beam Machining (Adv. Funct. Mater. 38/2022)

    Unmasking the Resolution–Throughput Tradespace of Focused‐Ion‐Beam Machining (Adv. Funct. Mater. 38/2022) by Madison, Andrew C., Villarrubia, John S., Liao, Kuo‐Tang, Copeland, Craig R., Schumacher, Joshua, Siebein, Kerry, Ilic, B. Robert, Liddle, J. Alexander, Stavis, Samuel M.

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  5. 5
    An a Posteriori Error Estimate for Scanning Electron Microscope Simulation with Adaptive Mesh Refinement

    An a Posteriori Error Estimate for Scanning Electron Microscope Simulation with Adaptive Mesh Refinement by Mitchell, William F., Villarrubia, John S.

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  6. 6
    Electron Inelastic Mean Free Paths for LiF, CaF2, Al2O3, and Liquid Water from 433 keV down to the Energy Gap

    Electron Inelastic Mean Free Paths for LiF, CaF2, Al2O3, and Liquid Water from 433 keV down to the Energy Gap by Flores-Mancera, Miguel Angel, Villarrubia, John S, Massillon-JL, Guerda

    Published in ACS omega
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  7. 7
    An accurate Monte Carlo sampler for electron elastic scattering angular distributions between 50 eV and 300 keV

    An accurate Monte Carlo sampler for electron elastic scattering angular distributions between 50 eV and 300 keV by Villarrubia, John

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  8. 8
    Three-Dimensional (3D) Nanometrology Based on Scanning Electron Microscope (SEM) Stereophotogrammetry

    Three-Dimensional (3D) Nanometrology Based on Scanning Electron Microscope (SEM) Stereophotogrammetry by Tondare, Vipin N., Villarrubia, John S., Vladár, András E.

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  9. 9
    Electron Inelastic Mean Free Paths for LiF, CaF 2 , Al 2 O 3 , and Liquid Water from 433 keV down to the Energy Gap

    Electron Inelastic Mean Free Paths for LiF, CaF 2 , Al 2 O 3 , and Liquid Water from 433 keV down to the Energy Gap by Flores-Mancera, Miguel Angel, Villarrubia, John S, Massillon-Jl, Guerda

    Published in ACS omega
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  10. 10
    Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron Microscope

    Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron Microscope by Postek, Michael T., Vladár, András E., Villarrubia, John S., Muto, Atsushi

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  11. 11
    Nanoindentation of polymers: an overview

    Nanoindentation of polymers: an overview by VanLandingham, Mark R., Villarrubia, John S., Guthrie, William F., Meyers, Greg F.

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  12. 12
    Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope - Part 2

    Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope - Part 2 by Postek, Michael T., Villarrubia, John, Vladár, András E., Muto, Atsushi

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  13. 13
    Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope

    Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope by Postek, Michael T., Villarrubia, John, Vladar, Andras E., Muto, Atsushi

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  14. 14
    Line Edge Roughness and Cross Sectional Characterization of Sub-50 nm Structures Using Critical Dimension Small Angle X-ray Scattering

    Line Edge Roughness and Cross Sectional Characterization of Sub-50 nm Structures Using Critical Dimension Small Angle X-ray Scattering by Wang, Chengqing, Jones, Ronald L, Lin, Eric K, Wu, Wen-li, Ho, Derek L, Villarrubia, John S, Choi, Kwang-Woo, Clarke, James S, Roberts, Jeanette, Bristol, Robert, Bunday, Benjamin

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  15. 15
    Advanced electron microscopy needs for nanotechnology and nanomanufacturing

    Advanced electron microscopy needs for nanotechnology and nanomanufacturing by Postek, Michael T., Villarrubia, John S., Vladár, András E.

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  16. 16
    Unmasking the resolution\(-\)throughput tradespace of focused-ion-beam machining

    Unmasking the resolution\(-\)throughput tradespace of focused-ion-beam machining by Madison, Andrew C, Villarrubia, John S, Kuo-Tang, Liao, Copeland, Craig R, Schumacher, Joshua, Siebein, Kerry, Ilic, B Robert, Liddle, J Alexander, Stavis, Samuel M

    Published in arXiv.org
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  17. 17
    Linewidth Roughness and Cross-sectional Measurements of Sub-50 nm Structures Using CD-SAXS and CD-SEM

    Linewidth Roughness and Cross-sectional Measurements of Sub-50 nm Structures Using CD-SAXS and CD-SEM by Chengqing Wang, Kwang-Woo Choi, Wei-En Fu, Jones, R.L., Ho, D.L., Soles, C., Lin, E.K., Wen-li Wu, Clarke, J.S., Villarrubia, J.S., Bunday, B.

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  18. 18
    Probing Electrified Liquid-Solid Interfaces with Scanning Electron Microscopy

    Probing Electrified Liquid-Solid Interfaces with Scanning Electron Microscopy by Guo, Hongxuan, Yulaev, Alexander, Strelcov, Evgheni, Tselev, Alexander, Arble, Christopher, Vladar, Andras E, Villarrubia, John S, Kolmakov, Andrei

    Published in arXiv.org
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  19. 19
    High-Energy Electron/Solid State Interaction Modeling with MONSEL

    High-Energy Electron/Solid State Interaction Modeling with MONSEL by Katsap, V., Villarrubia, J.

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  20. 20
    High-Energy Electron/Solid State Interaction Modeling with MONSEL

    High-Energy Electron/Solid State Interaction Modeling with MONSEL by Katsap, V, Villarrubia, John

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