Search Results - Vlaikova, Emilia

  • Showing 1 - 4 results of 4
Refine Results
  1. 1
    A refractometric sensor using index-sensitive mode resonance between single-mode fiber and thin film amorphous silicon waveguide

    A refractometric sensor using index-sensitive mode resonance between single-mode fiber and thin film amorphous silicon waveguide by Andreev, Andrey, Pantchev, Blagoy, Danesh, Parvaneh, Zafirova, Blagovesta, Karakoleva, Elka, Vlaikova, Emilia, Alipieva, Emilia

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    Effect of High-temperature Annealing on Evaporated Silicon Oxide Films: A Spectroscopic Ellipsometry Study

    Effect of High-temperature Annealing on Evaporated Silicon Oxide Films: A Spectroscopic Ellipsometry Study by Szekeres, Anna, Vlaikova, Emilia, Lohner, Tivadar, Petrik, Peter, Cziraki, Agnes, Zlobin, S., Shepeliavyi, P.

    Get full text
    Conference Proceeding
    Save to List
    Saved in:
  3. 3
    Investigation of p-Type MOS Structure Irradiated with 23 MeV Electrons

    Investigation of p-Type MOS Structure Irradiated with 23 MeV Electrons by Kaschieva, Sonia, Halova, Elena, Vlaikova, Emilia, Alexandrova, Sashka, Valcheva, Evgenia, Dmitriev, Sergey

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  4. 4
    Investigation of p-type MOS structure irradiated with 23 MeV electrons

    Investigation of p-type MOS structure irradiated with 23 MeV electrons by KASCHIEVA, Sonia, HALOVA, Elena, VLAIKOVA, Emilia, ALEXANDROVA, Sashka, VALCHEVA, Evgenia, DMITRIEV, Sergey

    Get full text
    Conference Proceeding
    Save to List
    Saved in:

Search Tools: