Search Results - Wühn, Mario

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  1. 1
    On the Importance of the Headgroup Substrate Bond in Thiol Monolayers:  A Study of Biphenyl-Based Thiols on Gold and Silver

    On the Importance of the Headgroup Substrate Bond in Thiol Monolayers:  A Study of Biphenyl-Based Thiols on Gold and Silver by Rong, Hai-Tao, Frey, Stefan, Yang, Yong-Jie, Zharnikov, Michael, Buck, Manfred, Wühn, Mario, Wöll, Christof, Helmchen, Günter

    Published in Langmuir
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  2. 2
    Self-assembly of 1-nitronaphthalene on Au(111)

    Self-assembly of 1-nitronaphthalene on Au(111) by Böhringer, Matthias, Morgenstern, Karina, Schneider, Wolf-Dieter, Wühn, Mario, Wöll, Christof, Berndt, Richard

    Published in Surface science
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  3. 3
    Interaction of ethylbenzene and styrene with iron oxide model catalyst films at low coverages : A NEXAFS study

    Interaction of ethylbenzene and styrene with iron oxide model catalyst films at low coverages : A NEXAFS study by JOSEPH, Yvonne, WÜHN, Mario, NIKLEWSKI, Arno, RAUKE, Wolfgang, WEISS, Werner, WÖLL, Christof, SCHLÖGL, Robert

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  4. 4
    Bulk and Surface Investigation of Photooriented Polymer Films

    Bulk and Surface Investigation of Photooriented Polymer Films by Strehmel, Veronika, Ziegler, Andreas, Rutloh, Michael, Jung, Christoph, Stumpe, Joachim, Ruhmann, Ralf, Kostromin, Sergej, Wühn, Mario, Niklewski, Arno, Reiss, Sebastian, Wöll, Christof

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  5. 5
    Bulk and surface investigation of photooriented polymer films

    Bulk and surface investigation of photooriented polymer films by STREHMEL, Veronika, ZIEGLER, Andreas, WÖLL, Christof, RUTLOH, Michael, JUNG, Christoph, STUMPE, Joachim, RUHMANN, Ralf, KOSTROMIN, Sergej, WÜHN, Mario, NIKLEWSKI, Arno, REISS, Sebastian

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  6. 6
    Direct correlation of electrical reliability data to SEM analysis for deep trench dielectric weakness

    Direct correlation of electrical reliability data to SEM analysis for deep trench dielectric weakness by Wuhn, M., Diestel, G., Obry, M.

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