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Impact of Electroforming Current on Self-Compliance Resistive Switching in an ITO/Gd:SiOx/TiN Structure
by
TSENG, Hsueh-Chih
,
CHANG, Ting-Chang
,
WANG, Ying-Lang
,
CHU, Ann-Kuo
,
WU, Yi-Chun
,
WU, Sei-Wei
,
HUANG, Jheng-Jie
,
CHEN, Yu-Ting
,
YANG, Jyun-Bao
,
LIN, Tzu-Ping
,
SZE, Simon M
,
TSAI, Ming-Jinn
Published in
IEEE electron device letters
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Impact of Electroforming Current on Self-Compliance Resistive Switching in an /SiO}/ Structure
by
Tseng, Hsueh-Chih
,
Chang, Ting-Chang
,
Wu, Yi-Chun
,
Wu, Sei-Wei
,
Huang, Jheng-Jie
,
Chen, Yu-Ting
,
Yang, Jyun-Bao
,
Lin, Tzu-Ping
,
Sze, Simon. M.
,
Tsai, Ming-Jinn
,
Wang, Ying-Lang
,
Chu, Ann-Kuo
Published in
IEEE electron device letters
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Ieee Electron Device Letters
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Subjects
Indium Tin Oxide
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Resistance Switching
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Resistive Random Access Memory
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Self-Built Current Compliance
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Applied Sciences
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Design. Technologies. Operation Analysis. Testing
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Electrodes
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Electronics
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Engineering
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Engineering, Electrical & Electronic
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Exact Sciences And Technology
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Integrated Circuits
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Integrated Circuits By Function
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Ions
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Resistance
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Resistors
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Science & Technology
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Semiconductor Electronics. Microelectronics. Optoelectronics. Solid State Devices
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Switches
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Technology
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Ieee Electronic Library (Iel) Journals
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