Search Results - Wabiszewski, G. E.

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  1. 1
    Angle-resolved environmental X-ray photoelectron spectroscopy: A new laboratory setup for photoemission studies at pressures up to 0.4 Torr

    Angle-resolved environmental X-ray photoelectron spectroscopy: A new laboratory setup for photoemission studies at pressures up to 0.4 Torr by Mangolini, F., Åhlund, J., Wabiszewski, G. E., Adiga, V. P., Egberts, P., Streller, F., Backlund, K., Karlsson, P. G., Wannberg, B., Carpick, R. W.

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  2. 2
    Characterization of Microscale Wear in a Polysilicon-Based MEMS Device Using AFM and PEEM-NEXAFS Spectromicroscopy

    Characterization of Microscale Wear in a Polysilicon-Based MEMS Device Using AFM and PEEM-NEXAFS Spectromicroscopy by Grierson, D. S, Konicek, A. R, Wabiszewski, G. E, Sumant, A. V, de Boer, M. P, Corwin, A. D, Carpick, R. W

    Published in Tribology letters
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  3. 3
    Ultra thin AlN piezoelectric nano-actuators

    Ultra thin AlN piezoelectric nano-actuators by Sinha, N., Wabiszewski, G.E., Mahameed, R., Felmetsger, V.V., Tanner, S.M., Carpick, R.W., Piazza, G.

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    Conference Proceeding
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