Search Results - Wadden, Darren

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    A DFT Loopback Scheme for ADC ENOB Testing Using an All-Digital ATE

    A DFT Loopback Scheme for ADC ENOB Testing Using an All-Digital ATE by Aouini, Sadok, Kurowski, Christopher, Ben-Hamida, Naim, Bousquet, Jean-Francois, McPherson, Douglas, Wadden, Darren

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