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Effects of die coatings, mold compounds, and test conditions on temperature cycling failures
by
Nguyen, L.T.
,
Gee, S.A.
,
Johnson, M.R.
,
Grimm, H.E.
,
Berardi, H.
,
Walberg, R.L.
Published in
IEEE transactions on components, packaging, and manufacturing technology. Part A
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Effects of die coatings, mold compounds and test conditions on temperature cycling failures
by
Nguyen, L.T.
,
Gee, S.A.
,
Johnson, M.R.
,
Grimm, H.E.
,
Berardi, H.
,
Walberg, R.L.
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Ieee Transactions On Components, Packaging, And Manufacturing Technology. Part A
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Coatings
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Delamination
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Electric Shock
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Electronic Packaging Thermal Management
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Electronics Packaging
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Engineering
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Engineering, Electrical & Electronic
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Engineering, Manufacturing
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Military Standards
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Plastic Packaging
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Science & Technology
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Technology
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Temperature
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Testing
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Thermal Stresses
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Materials Science
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Materials Science, Multidisciplinary
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Ieee Electronic Library (Iel) Conference Proceedings
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Ieee Xplore All Conference Series
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Ieee Xplore (Online Service)
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Ieee Xplore All Journals
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