Search Results - Walker, Duncan M. Hank

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  1. 1
    Topological Heuristics for Scan Test Overhead Reduction

    Topological Heuristics for Scan Test Overhead Reduction by Chakraborty, Avijit, Walker, D. M. H.

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  2. 2
    Power supply noise control in pseudo functional test

    Power supply noise control in pseudo functional test by Tengteng Zhang, Walker, Duncan M. Hank

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  3. 3
    Improved power supply noise control for pseudo functional test

    Improved power supply noise control for pseudo functional test by Tengteng Zhang, Walker, Duncan M. Hank

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  4. 4
    I sub(DDQ) testing of bridging faults in logic resources of reconfigurable field programmable gate arrays

    I sub(DDQ) testing of bridging faults in logic resources of reconfigurable field programmable gate arrays by Zhao, Lan, Walker, Duncan M Hank, Lombardi, Fabrizio

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  5. 5
    Modeling Power Supply Noise in Delay Testing

    Modeling Power Supply Noise in Delay Testing by Jing Wang, Walker, D.M., Xiang Lu, Majhi, A., Kruseman, B., Gronthoud, G., Villagra, L.E., van de Wiel, P.J.A., Eichenberger, S.

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