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Search Results - Wan, Katch
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Low Temperature Curable Polyimide Film Properties and WLP Reliability Performance with Various Curing Conditions
by
Chen, Yu Chuan
,
Wan, Katch
,
Chang, Chen An
,
Lee, Rick
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The Comparative Study to Enhance Board Level Reliability Performance of Wafer Level Package At 0.25 mm Pitch Using Micro-Ball Drop and Electroplated Solder Technology
by
Kuei Hsiao Kuo
,
Yi Sin Ting
,
Chui Feng Weng
,
Feng Lung Chien
,
Wan, Katch
,
Ho, C. S.
,
Lee, Rick
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Engineering
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Engineering, Electrical & Electronic
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Polyimides
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Resistance
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Science & Technology
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Technology
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Blr
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Board Level Reliability
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Chemical Resistance
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Chemicals
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Curing
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Curing Level
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Electric Shock
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Glass
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Legged Locomotion
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Metals
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Polyimide
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Redistribution Metal Layer
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Reliability
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Semiconductor Device Reliability
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Ieee Electronic Library (Iel) Conference Proceedings
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Ieee Xplore All Conference Series
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