Search Results - Wang, Ming-Jaan

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  1. 1
    Using EWMA control schemes for monitoring wafer quality in negative binomial process

    Using EWMA control schemes for monitoring wafer quality in negative binomial process by Yu, Fong-Jung, Yang, Yung-Yu, Wang, Ming-Jaan, Wu, Zhang

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  2. 2
    Simulated annealing based parallel genetic algorithm for facility layout problem

    Simulated annealing based parallel genetic algorithm for facility layout problem by Ku, Meei-Yuh, Hu, Michael H., Wang, Ming-Jaan

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  3. 3
    A solution to the unequal area facilities layout problem by genetic algorithm

    A solution to the unequal area facilities layout problem by genetic algorithm by Wang, Ming-Jaan, Hu, Michael H., Ku, Meei-Yuh

    Published in Computers in industry
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  4. 4
    Using genetic algorithms on facilities layout problems

    Using genetic algorithms on facilities layout problems by Hu, Michael H., Wang, Ming-Jaan

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