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    Atomistic comparative study of VUV photodeposited silicon nitride on InP(1 0 0) by simulation and atomic force microscopy: discrete representation and topological analysis

    Atomistic comparative study of VUV photodeposited silicon nitride on InP(1 0 0) by simulation and atomic force microscopy: discrete representation and topological analysis by Flicstein, J, Guillonneau, E, Marquez, J, How Kee Chun, L.S, Maisonneuve, D, David, C, Wang, Zh.Zh, Palmier, J.F, Courant, J.L

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