Search Results - Washburn, Gordon B.

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  1. 1
    Retirement

    Retirement by Washburn, Gordon B

    Published in Archives of Asian art
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  2. 2
    Handsome Production

    Handsome Production by Washburn, Gordon B., Bentley, Esther M.

    Published in Leonardo (Oxford)
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  3. 3
    Letters = Lettres

    Letters = Lettres by Foster, John, Kepes, Gyorgy, Delafresnaye, J. F, Kondratiev, K. Ya, Kovda, Victor, Ahmed, Jalaluddin, Alcopley, L, , Jaroslav Němec, , Jiří Kotalík, Jones, Peter Lloyd, Washburn, Gordon B, Bentley, Esther M, Land, Dick, George, Tom, George, Laverne, Besson, Tony, Holloway, John H, Taylor, Simon Watson

    Published in Leonardo (Oxford)
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  4. 4
    Global Genotype by Environment Prediction Competition Reveals That Diverse Modeling Strategies Can Deliver Satisfactory Maize Yield Estimates

    Global Genotype by Environment Prediction Competition Reveals That Diverse Modeling Strategies Can Deliver Satisfactory Maize Yield Estimates by Washburn, Jacob D, Varela, José Ignacio, Xavier, Alencar, Chen, Qiuyue, Ertl, David, Gage, Joseph L, Holland, James B, Lima, Dayane Cristina, Romay, Maria Cinta, Lopez-Cruz, Marco, de Los Campos, Gustavo, Barber, Wesley, Zimmer, Cristiano, Trucillo Silva, Ignacio, Rocha, Fabiani, Rincent, Renaud, Ali, Baber, Hu, Haixiao, Runcie, Daniel E, Gusev, Kirill, Slabodkin, Andrei, Bax, Phillip, Aubert, Julie, Gangloff, Hugo, Mary-Huard, Tristan, Vanrenterghem, Theodore, Quesada-Traver, Carles, Yates, Steven, Ariza-Suárez, Daniel, Ulrich, Argeo, Wyler, Michele, Kick, Daniel R, Bellis, Emily S, Causey, Jason L, Soriano Chavez, Emilio, Wang, Yixing, Piyush, Ved, Fernando, Gayara D, Hu, Robert K, Kumar, Rachit, Timon, Annan J, Venkatesh, Rasika, Segura Abá, Kenia, Chen, Huan, Ranaweera, Thilanka, Shiu, Shin-Han, Wang, Peiran, Gordon, Max J, Amos, B K, Busato, Sebastiano, Perondi, Daniel, Gogna, Abhishek, Psaroudakis, Dennis, Chen, C P James, Al-Mamun, Hawlader A, Danilevicz, Monica F, Upadhyaya, Shriprabha R, Edwards, David, de Leon, Natalia

    Published in Genetics (Austin)
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  5. 5
    Yield improvement for a 3.5-ns BiCMOS technology in a 200-mm manufacturing line

    Yield improvement for a 3.5-ns BiCMOS technology in a 200-mm manufacturing line by Chen, B., Hook, T., Starkey, G., Bhattacharyya, A., Faucher, M., Racine, C., Willets, C., Eslinger, S., Kulkarni, S., King, W., Washburn, C., Piccirillo, J., Mongeon, S., Johnson, A., Gabrielle, E.

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    Conference Proceeding
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