Search Results - Washington, E.B.K.

  • Showing 1 - 1 results of 1
Refine Results
  1. 1
    Thin-Film Thermal Conductivity Measurement Using Microelectrothermal Test Structures and Finite-Element-Model-Based Data Analysis

    Thin-Film Thermal Conductivity Measurement Using Microelectrothermal Test Structures and Finite-Element-Model-Based Data Analysis by Stojanovic, N., Jongsin Yun, Washington, E.B.K., Berg, J.M., Holtz, M.W., Temkin, H.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:

Search Tools: