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Evaluation of a plastic encapsulated package using a scalable thermal mechanical test chip
by
Hullinger, A.K.
,
Duffalo, J.M.
,
Niederkorn, A.J.
,
Wecker, N.J.
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A scalable thermal mechanical test chip for package characterization and qualifications
by
Duffalo, J.M.
,
Domer, S.M.
,
Hollstein, R.L.
,
Hullinger, A.K.
,
Niederkorn, A.J.
,
Wecker, N.J.
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Conference Proceeding
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Conference Proceedings
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Application Specific Integrated Circuits
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Assembly
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Circuit Testing
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Costs
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Integrated Circuit Packaging
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Integrated Circuit Reliability
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Qualifications
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Silicon
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Vehicles
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Engineering
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Engineering, Electrical & Electronic
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Materials Science
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Materials Science, Characterization & Testing
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Materials Science, Coatings & Films
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Physical Sciences
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Physics
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Physics, Applied
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Physics, Condensed Matter
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Plastic Packaging
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Science & Technology
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Ieee Electronic Library (Iel) Conference Proceedings
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