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Calculation of dielectric constant of buffer layer graphene on SiC measured by spectroscopy ellipsometry using Gauss-Newton numerical inversion method
by
Megasari, Kiki
,
Widianto, Eri
,
Efelina, Vita
,
Abraha, Kamsul
,
Wee, Andrew Thye Seen
,
Rusydi, Andrivo
,
Santoso, Iman
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Conference Proceedings
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Buffer Layers
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Dielectrics
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Graphene
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Mathematical Analysis
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Permittivity
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Physical Sciences
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Physics
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Physics, Applied
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Science & Technology
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Spectroellipsometry
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Spectroscopic Analysis
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Substrates
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Temperature
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Thickness
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American Institute Of Physics:jisc Collections:transitional Journals Agreement 2021-23 (Reading List)
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Aip Digital Archive
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American Institute Of Physics (Aip) Publications
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