Search Results - Wegelin, Frederik

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  1. 1
    Magnetization dynamics in polycrystalline Permalloy and epitaxial Co platelets observed by time-resolved photoemission electron microscopy

    Magnetization dynamics in polycrystalline Permalloy and epitaxial Co platelets observed by time-resolved photoemission electron microscopy by Wegelin, Frederik, Krasyuk, Alexander, Valdaitsev, Dmitrii A., Nepijko, Sergej A., Elmers, Hans Joachim, Schönhense, Gerd, Schneider, Claus M.

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  2. 2
    Magnetization dynamics in polycrystalline Permalloy and epitaxial Co platelets observed by time-resolved photoemission electron microscopy : Synchrotron Radiation Research at BESSY

    Magnetization dynamics in polycrystalline Permalloy and epitaxial Co platelets observed by time-resolved photoemission electron microscopy : Synchrotron Radiation Research at BESSY by WEGELIN, Frederik, KRASYUK, Alexander, VALDAITSEV, Dmitrii A, NEPIJKO, Sergej A, JOACHIM ELMERS, Hans, SCHÖNHENSE, Gerd, SCHNEIDER, Claus M

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  3. 3
    Magnetic patterning of exchange-coupled multilayers

    Magnetic patterning of exchange-coupled multilayers by Demidov, Vladislav E., Kholin, Dmitry I., Demokritov, Sergej O., Hillebrands, Burkard, Wegelin, Frederik, Marien, Jan

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  4. 4
    Stroboscopic XMCD–PEEM imaging of standing and propagating spinwave modes in permalloy thin-film structures

    Stroboscopic XMCD–PEEM imaging of standing and propagating spinwave modes in permalloy thin-film structures by Wegelin, Frederik, Krasyuk, Alexander, Elmers, Hans-Joachim, Nepijko, Sergej A., Schneider, Claus M., Schönhense, Gerd

    Published in Surface science
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  5. 5
    Defektanalyse von a‐C‐ und CNx‐Schichten mittels Röntgen‐Photoemissions‐Elektronenmikroskopie (X‐PEEM)

    Defektanalyse von a‐C‐ und CNx‐Schichten mittels Röntgen‐Photoemissions‐Elektronenmikroskopie (X‐PEEM) by Frederik, Wegelin, Ziethen, Christian, Ohr, Ralph, Neuhäuser, Marc, Hilgers, Heinz, Schönhense, Gerd

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  6. 6
    Defektanalyse von a-C- und CNx-Schichten mittels Röntgen-Photoemissions-Elektronenmikroskopie (X-PEEM)Characterization of stoichiometric defects in diamond, a-C and CNx thin films with Soft X-ray photoelectron microscopy (X-PEEM)

    Defektanalyse von a-C- und CNx-Schichten mittels Röntgen-Photoemissions-Elektronenmikroskopie (X-PEEM)Characterization of stoichiometric defects in diamond, a-C and CNx thin films... by Frederik, Wegelin, Ziethen, Christian, Ohr, Ralph, Neuhäuser, Marc, Hilgers, Heinz, Schönhense, Gerd

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  7. 7
    Defektanalyse von a-C- und CNx-Schichten mittels Röntgen-Photoemissions-Elektronenmikroskopie (X-PEEM)

    Defektanalyse von a-C- und CNx-Schichten mittels Röntgen-Photoemissions-Elektronenmikroskopie (X-PEEM) by Frederik, Wegelin, Ziethen, Christian, Ohr, Ralph, Neuhäuser, Marc, Hilgers, Heinz, Schönhense, Gerd

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