Dengue: current state one year before WHO 2010-2020 goals by Wellekens, K, Betrains, A, De Munter, P, Peetermans, W

Get full text

CMOS Process-Compatible High-Power Low-Leakage AlGaN/GaN MISHEMT on Silicon by Van Hove, M., Boulay, S., Bahl, S. R., Stoffels, S., Xuanwu Kang, Wellekens, D., Geens, K., Delabie, A., Decoutere, S.

Get full text

1.2 kV Enhancement-Mode p-GaN Gate HEMTs on 200 mm Engineered Substrates by Kumar, S., Geens, K., Vohra, A., Wellekens, D., Cingu, D., Fabris, E., Cosnier, T., Hahn, H., Bakeroot, B., Posthuma, N., Langer, R., Decoutere, S.

Get full text

An industry-ready 200 mm p-GaN E-mode GaN-on-Si power technology by Posthuma, N. E., You, S., Stoffels, S., Wellekens, D., Liang, H., Zhao, M., De Jaeger, B., Geens, K., Ronchi, N., Decoutere, S., Moens, P., Banerjee, A., Ziad, H., Tack, M.

Request full text

Au-free CMOS-compatible AlGaN/GaN HEMT processing on 200 mm Si substrates by De Jaeger, B., Van Hove, M., Wellekens, D., Kang, X., Liang, H., Mannaert, G., Geens, K., Decoutere, S.

Request full text

Evaluation of novel carrier substrates for high reliability and integrated GaN devices in a 200 mm complementary metal–oxide semiconductor compatible process by Stoffels, S., Geens, K., Li, X., Wellekens, D., You, S., Zhao, M., Borga, M., Zanoni, E., Meneghesso, G., Meneghini, M., Posthuma, N.E., Van Hove, M., Decoutere, S.

Get full text

GaN-on-SOI: Monolithically Integrated All-GaN ICs for Power Conversion by Li, X., Stoffels, S., Bakeroot, B., Wellekens, D., Vanhove, B., Cosnier, T., Langer, R., Marcon, D., Groeseneken, G., Decoutere, S., Amirifar, N., Geens, K., Zhao, M., Guo, W., Liang, H., You, S., Posthuma, N., Jaeger, B. De

Request full text

Performance and reliability of HfAlOx-based interpoly dielectrics for floating-gate Flash memory by GOVOREANU, B, WELLEKENS, D, HASPESLAGH, L, BRUNCO, D. P, DE VOS, J, RUIZ AGUADO, D, BLOMME, P, VAN DER ZANDEN, K, VAN HOUDT, J

Get full text

200 V GaN-on-SOI Smart Power Platform for Monolithic GaN Power ICs by Cosnier, T., Syshchyk, O., De Jaeger, B., Geens, K., Cingu, D., Fabris, Elena, Borga, M., Vohra, A., Zhao, M., Bakeroot, B., Wellekens, D., Magnani, A., Vudumula, P., Chatterjee, U., Langer, R., Decoutere, S.

Request full text

Al2O3 Based Flash Interpoly Dielectrics: a Comparative Retention Study by Wellekens, D., Blomme, P., Govoreanu, B., De Vos, J., Haspeslagh, L., Van Houdt, J., Brunco, D.P., van der Zanden, K.

Request full text

Performance and reliability of HfAlO x -based interpoly dielectrics for floating-gate Flash memory by Govoreanu, B., Wellekens, D., Haspeslagh, L., Brunco, D.P., De Vos, J., Aguado, D. Ruiz, Blomme, P., van der Zanden, K., Van Houdt, J.

Get full text

A scalable Stacked Gate NOR/NAND Flash Technology compatible with high-k and metal gates for sub 45nm generations by De Vos, J., Haspeslagh, L., Demand, M., Devriendt, K., Wellekens, D., Beckx, S., Houdt, J.V.

Request full text

Dynamic sharings of Gaussian densities using phonetic features by Kyung-Tak Lee, Wellekens, C.J.

Request full text