Evaluation and Application of U.S. Medical Proton Facilities for Single Event Effects Test by Wie, Brian S., LaBel, Kenneth A., Turflinger, Thomas L., Wert, Jerry L., Foster, Charles C., Reed, Robert A., Kostic, Andrew D., Moss, Steven C., Guertin, Steven M., George, Jeffrey S., Pankuch, Mark, Dong, Lei, Bloch, Charles, Laub, Steve

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First Record of Single-Event Upset on Ground, Cray-1 Computer at Los Alamos in 1976 by Normand, E, Wert, J L, Quinn, H, Fairbanks, T D, Michalak, S, Grider, G, Iwanchuk, P, Morrison, J, Wender, S, Johnson, S

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HBD layout isolation techniques for multiple node charge collection mitigation by Black, J.D., Sternberg, A.L., Alles, M.L., Witulski, A.F., Bhuva, B.L., Massengill, L.W., Benedetto, J.M., Baze, M.P., Wert, J.L., Hubert, M.G.

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Neutron-induced single event burnout in high voltage electronics by Normand, E., Wert, J.L., Oberg, D.L., Majewski, P.R., Voss, P., Wender, S.A.

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First Nondestructive Measurements of Power MOSFET Single Event Burnout Cross Sections by Oberg, Dennis L., Wert, Jerry L.

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MISSE-6 Post-Flight Examination, Disassembly and Analysis Results by Pippin, Harold G, Wert, Jerry L, Robb, Andrew

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Measurement of SEU Thresholds and Cross Sections at Fixed Incidence Angles by Criswell, Tommy L., Oberg, Dennis L., Wert, Jerry L., Measel, Paul R., Wilson, W. E.

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Use of PuBe source to simulate neutron-induced single event upsets in static RAMs by Normand, E., Wert, J.L., Doherty, W.R., Oberg, D.L., Measel, P.R., Criswell, T.L.

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Measurement of single event effects in the 87C51 microcontroller by Oberg, D.L., Wert, J.L., Normand, E., Ness, J.D., Majewski, P.P., Kennerud, R.A.

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Single Event Upset Testing by Criswell, Tommy L, Oberg, Dennis L, Wert, Jerry L, Measel, Paul R

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Intercomparison of six ambient [CH2O] measurement techniques by Gilpin, Tim, Apel, Eric, Fried, Alan, Wert, Bryan, Calvert, Jack, Genfa, Zhang, Dasgupta, Purnendu, Harder, Jerry W., Heikes, Brian, Hopkins, Brian, Westberg, Hal, Kleindienst, Tad, Lee, Yin‐Nan, Zhou, Xianliang, Lonneman, William, Sewell, Scott

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Electronics Cooling Using a Self-Contained, Sub-Cooled Pumped Liquid System by Bilski, W.J., Baldassarre, G., Connors, M., Toth, J., Wert, K.L.

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